Synchrotron X-ray fractography: A novel technique for fracture-surface analysis

Synchrotron X-ray fractography (SXRF), a new non-destructive technique for studying the sub-surface microstructure of cleaved samples which allows correlation with the associated surface morphology is described.

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Bibliographic Details
Published in:Materials letters 1983-07, Vol.2 (1), p.6-11
Main Authors: Hmelo, A.B., Bilello, J.C., Davies, S.T., Bowen, D.K.
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Fracture mechanics (crack, fatigue, damage...)
Fractures
Fundamental areas of phenomenology (including applications)
Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology
Metals. Metallurgy
Physics
Solid mechanics
Structural and continuum mechanics
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Description
Summary:Synchrotron X-ray fractography (SXRF), a new non-destructive technique for studying the sub-surface microstructure of cleaved samples which allows correlation with the associated surface morphology is described.
ISSN:0167-577X
1873-4979
DOI:10.1016/0167-577X(83)90021-6