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A two-stage monolithic IF amplifier utilizing a Ta2O5 capacitor
A two-stage monolithic IF amplifier incorporating a sputtered Ta2O5 capacitor has been fabricated. The monolithic capacitor is based on a composite layer structure consisting of Au, Ta, Ta2O5, Ta, and Au. This layered structure is sequentially deposited in a single sputtering run, which eliminates p...
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Published in: | IEEE transactions on electron devices 1983-01, Vol.ED-30, p.21-26 |
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Language: | English |
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container_end_page | 26 |
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container_start_page | 21 |
container_title | IEEE transactions on electron devices |
container_volume | ED-30 |
creator | Chu, A Mahoney, L J Courtney, W E Finn, M C Piacentini, W J Donnelly, J P Elta, M E |
description | A two-stage monolithic IF amplifier incorporating a sputtered Ta2O5 capacitor has been fabricated. The monolithic capacitor is based on a composite layer structure consisting of Au, Ta, Ta2O5, Ta, and Au. This layered structure is sequentially deposited in a single sputtering run, which eliminates particulate contamination. As a result, a thin pinhole-free dielectric layer can be deposited over large areas, and 140-pF capacitors have been fabricated with excellent yields. The large unit area capacitance of 1500 pF/59 mm available with the present process has the potential for reducing the size of matching and bias circuits in microwave monolithic circuits and hybrid thin-film circuits. The monolithic amplifiers exhibit a gain of 17.5 + or - 1.0 dB from 1.2 to 2.6 GHz and a minimum noise figure of about 2.7 dB, with an associated gain of 17.5 dB at 1.7 GHz. |
doi_str_mv | 10.1109/T-ED.1983.21064 |
format | article |
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The monolithic capacitor is based on a composite layer structure consisting of Au, Ta, Ta2O5, Ta, and Au. This layered structure is sequentially deposited in a single sputtering run, which eliminates particulate contamination. As a result, a thin pinhole-free dielectric layer can be deposited over large areas, and 140-pF capacitors have been fabricated with excellent yields. The large unit area capacitance of 1500 pF/59 mm available with the present process has the potential for reducing the size of matching and bias circuits in microwave monolithic circuits and hybrid thin-film circuits. The monolithic amplifiers exhibit a gain of 17.5 + or - 1.0 dB from 1.2 to 2.6 GHz and a minimum noise figure of about 2.7 dB, with an associated gain of 17.5 dB at 1.7 GHz.</description><identifier>ISSN: 0018-9383</identifier><identifier>DOI: 10.1109/T-ED.1983.21064</identifier><language>eng</language><ispartof>IEEE transactions on electron devices, 1983-01, Vol.ED-30, p.21-26</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Chu, A</creatorcontrib><creatorcontrib>Mahoney, L J</creatorcontrib><creatorcontrib>Courtney, W E</creatorcontrib><creatorcontrib>Finn, M C</creatorcontrib><creatorcontrib>Piacentini, W J</creatorcontrib><creatorcontrib>Donnelly, J P</creatorcontrib><creatorcontrib>Elta, M E</creatorcontrib><title>A two-stage monolithic IF amplifier utilizing a Ta2O5 capacitor</title><title>IEEE transactions on electron devices</title><description>A two-stage monolithic IF amplifier incorporating a sputtered Ta2O5 capacitor has been fabricated. The monolithic capacitor is based on a composite layer structure consisting of Au, Ta, Ta2O5, Ta, and Au. This layered structure is sequentially deposited in a single sputtering run, which eliminates particulate contamination. As a result, a thin pinhole-free dielectric layer can be deposited over large areas, and 140-pF capacitors have been fabricated with excellent yields. The large unit area capacitance of 1500 pF/59 mm available with the present process has the potential for reducing the size of matching and bias circuits in microwave monolithic circuits and hybrid thin-film circuits. The monolithic amplifiers exhibit a gain of 17.5 + or - 1.0 dB from 1.2 to 2.6 GHz and a minimum noise figure of about 2.7 dB, with an associated gain of 17.5 dB at 1.7 GHz.</description><issn>0018-9383</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNotzDFPAyEYgGEGTVqrc1cmN07g4ziYTFNbbdKky-0NUK5iuOM8uJj46zXR6c2zvAitGa0Yo_qpJbuXimkFFWdUihu0pJQpokHBAt3l_PFLKQRfoucNLl-J5GKuHvdpSDGU9-DwYY9NP8bQBT_huYQYvsNwxQa3hp9q7MxoXChpuke3nYnZP_x3hdr9rt2-kePp9bDdHMmodSHQSEUtWHERxtJGONt44zg17CKFBWqpsl0tJHjQtfS6aRyAldxRkLwDBiv0-Lcdp_Q5-1zOfcjOx2gGn-Z85oIxzpSCH3QoSN0</recordid><startdate>19830101</startdate><enddate>19830101</enddate><creator>Chu, A</creator><creator>Mahoney, L J</creator><creator>Courtney, W E</creator><creator>Finn, M C</creator><creator>Piacentini, W J</creator><creator>Donnelly, J P</creator><creator>Elta, M E</creator><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19830101</creationdate><title>A two-stage monolithic IF amplifier utilizing a Ta2O5 capacitor</title><author>Chu, A ; Mahoney, L J ; Courtney, W E ; Finn, M C ; Piacentini, W J ; Donnelly, J P ; Elta, M E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p99t-37680b3b4d4ab074cb7eac20a1d64b30b08bf5463e3956e977c33b62c0362f313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chu, A</creatorcontrib><creatorcontrib>Mahoney, L J</creatorcontrib><creatorcontrib>Courtney, W E</creatorcontrib><creatorcontrib>Finn, M C</creatorcontrib><creatorcontrib>Piacentini, W J</creatorcontrib><creatorcontrib>Donnelly, J P</creatorcontrib><creatorcontrib>Elta, M E</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chu, A</au><au>Mahoney, L J</au><au>Courtney, W E</au><au>Finn, M C</au><au>Piacentini, W J</au><au>Donnelly, J P</au><au>Elta, M E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A two-stage monolithic IF amplifier utilizing a Ta2O5 capacitor</atitle><jtitle>IEEE transactions on electron devices</jtitle><date>1983-01-01</date><risdate>1983</risdate><volume>ED-30</volume><spage>21</spage><epage>26</epage><pages>21-26</pages><issn>0018-9383</issn><abstract>A two-stage monolithic IF amplifier incorporating a sputtered Ta2O5 capacitor has been fabricated. The monolithic capacitor is based on a composite layer structure consisting of Au, Ta, Ta2O5, Ta, and Au. This layered structure is sequentially deposited in a single sputtering run, which eliminates particulate contamination. As a result, a thin pinhole-free dielectric layer can be deposited over large areas, and 140-pF capacitors have been fabricated with excellent yields. The large unit area capacitance of 1500 pF/59 mm available with the present process has the potential for reducing the size of matching and bias circuits in microwave monolithic circuits and hybrid thin-film circuits. The monolithic amplifiers exhibit a gain of 17.5 + or - 1.0 dB from 1.2 to 2.6 GHz and a minimum noise figure of about 2.7 dB, with an associated gain of 17.5 dB at 1.7 GHz.</abstract><doi>10.1109/T-ED.1983.21064</doi><tpages>6</tpages></addata></record> |
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issn | 0018-9383 |
language | eng |
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source | IEEE Electronic Library (IEL) Journals |
title | A two-stage monolithic IF amplifier utilizing a Ta2O5 capacitor |
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