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Backscattering spectrometry of oxide films formed on aluminium in weakly alkaline solutions
The corrosion and passive behavior of high-purity Al in weakly alkaline solution (p H 7-10) has been studied by electrochemical measurements and by Auger electron spectroscopic investigations of oxide films formed. The films were found to be duplex ones, generally having a thin inner barrier layer (...
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Published in: | Electrochimica acta 1984-01, Vol.29 (8), p.1161-1162 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The corrosion and passive behavior of high-purity Al in weakly alkaline solution (p H 7-10) has been studied by electrochemical measurements and by Auger electron spectroscopic investigations of oxide films formed. The films were found to be duplex ones, generally having a thin inner barrier layer (whose thickness decreases with increasing p H) and a thicker outer nonbarrier layer (whose thickness increases with increasing p H). Some supplementary studies on such films by backscattering spectrometry using a normally incident beam of 2 MeV helium ions and measuring at a scattering angle of 165 deg and with a channel width of 5 keV, are reported.--AA. |
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ISSN: | 0013-4686 1873-3859 |
DOI: | 10.1016/0013-4686(84)87170-4 |