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On the thermal aspect of fretting wear—temperature measurement in the subsurface layer
In fretting wear, the kinetics of the oxide film formation as well as the microstructure and the mechanical properties of the subsurface layer depend significantly on the temperature field produced in the fretted zone. Information reported in the open literature indicates contradicting values for th...
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Published in: | Wear 1986-10, Vol.111 (4), p.363-376 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In fretting wear, the kinetics of the oxide film formation as well as the microstructure and the mechanical properties of the subsurface layer depend significantly on the temperature field produced in the fretted zone. Information reported in the open literature indicates contradicting values for the temperature produced at the interface. In the present study, an experimental method for direct measurement of the temperature profile in the subsurface layer has, therefore, been developed and verified. This method overcomes the limitations and the uncertainties inherent in methods of measurement used before. An error analysis indicated that the temperature gradient can be measured within ± 2.5%. The extent of the temperature measurement zone has been estimated by the theory of thermal constriction resistance and found to be in good agreement with some available experimental data. |
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ISSN: | 0043-1648 1873-2577 |
DOI: | 10.1016/0043-1648(86)90133-X |