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On the thermal aspect of fretting wear—temperature measurement in the subsurface layer

In fretting wear, the kinetics of the oxide film formation as well as the microstructure and the mechanical properties of the subsurface layer depend significantly on the temperature field produced in the fretted zone. Information reported in the open literature indicates contradicting values for th...

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Published in:Wear 1986-10, Vol.111 (4), p.363-376
Main Authors: Attia, M.H., Ko, P.L.
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Language:English
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description In fretting wear, the kinetics of the oxide film formation as well as the microstructure and the mechanical properties of the subsurface layer depend significantly on the temperature field produced in the fretted zone. Information reported in the open literature indicates contradicting values for the temperature produced at the interface. In the present study, an experimental method for direct measurement of the temperature profile in the subsurface layer has, therefore, been developed and verified. This method overcomes the limitations and the uncertainties inherent in methods of measurement used before. An error analysis indicated that the temperature gradient can be measured within ± 2.5%. The extent of the temperature measurement zone has been estimated by the theory of thermal constriction resistance and found to be in good agreement with some available experimental data.
doi_str_mv 10.1016/0043-1648(86)90133-X
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subjects Applied sciences
Condensed matter: structure, mechanical and thermal properties
Contact of materials. Friction. Wear
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Mechanical and acoustical properties of condensed matter
Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology
Metals, semimetals and alloys
Metals. Metallurgy
Physics
Specific materials
title On the thermal aspect of fretting wear—temperature measurement in the subsurface layer
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