Loading…
p-channel strained quantum well, field-effect transistor
A p-channel field-effect transistor with a 3.5 μm Cr/Au gate was fabricated from a modulation-doped GaAs/In0.2Ga0.8As/GaAs quantum well structure. Well-behaved transistor action was observed at both 300 and 77 K with extrinsic transconductances of 6.2 and 11.3 mS/mm, respectively. Shubnikov–deHaas m...
Saved in:
Published in: | Applied physics letters 1986-08, Vol.49 (8), p.461-463 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3 |
---|---|
cites | cdi_FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3 |
container_end_page | 463 |
container_issue | 8 |
container_start_page | 461 |
container_title | Applied physics letters |
container_volume | 49 |
creator | DRUMMOND, T. J ZIPPERIAN, T. E FRITZ, I. J SCHIRBER, J. E PLUT, T. A |
description | A p-channel field-effect transistor with a 3.5 μm Cr/Au gate was fabricated from a modulation-doped GaAs/In0.2Ga0.8As/GaAs quantum well structure. Well-behaved transistor action was observed at both 300 and 77 K with extrinsic transconductances of 6.2 and 11.3 mS/mm, respectively. Shubnikov–deHaas measurements prove the existence of a two-dimensional hole gas with a strain-shifted light-hole ground state associated with a light-hole mass of 0.154m0. |
doi_str_mv | 10.1063/1.97116 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_24180178</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24180178</sourcerecordid><originalsourceid>FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3</originalsourceid><addsrcrecordid>eNqN0E1LxDAQBuAgCq6r-Bd6EL2YdSZpk_Qoy_oBC170HKZpgpVuu5u0iP_e6i6ePQ0DDy8zL2OXCAsEJe9wUWpEdcRmCFpziWiO2QwAJFdlgafsLKWPaS2ElDNmtty9U9f5NktDpKbzdbYbqRvGTfbp2_Y2C41va-5D8G7IJtKlJg19PGcngdrkLw5zzt4eVq_LJ75-eXxe3q-5kwYGLrwMwkAoC2cqowzpXNS10mRkFcjlHjFHXXpRm-CIlNM5FM4RVEqAq4Kcs-t97jb2u9GnwW6a5KbLqPP9mKzI0QBq8x-ojVY4wZs9dLFPKfpgt7HZUPyyCPanQov2t8JJXh0iKTlqw_S8a9IfNwJyXaD8Bjlrbyk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24178761</pqid></control><display><type>article</type><title>p-channel strained quantum well, field-effect transistor</title><source>AIP Digital Archive</source><creator>DRUMMOND, T. J ; ZIPPERIAN, T. E ; FRITZ, I. J ; SCHIRBER, J. E ; PLUT, T. A</creator><creatorcontrib>DRUMMOND, T. J ; ZIPPERIAN, T. E ; FRITZ, I. J ; SCHIRBER, J. E ; PLUT, T. A</creatorcontrib><description>A p-channel field-effect transistor with a 3.5 μm Cr/Au gate was fabricated from a modulation-doped GaAs/In0.2Ga0.8As/GaAs quantum well structure. Well-behaved transistor action was observed at both 300 and 77 K with extrinsic transconductances of 6.2 and 11.3 mS/mm, respectively. Shubnikov–deHaas measurements prove the existence of a two-dimensional hole gas with a strain-shifted light-hole ground state associated with a light-hole mass of 0.154m0.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.97116</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Transistors</subject><ispartof>Applied physics letters, 1986-08, Vol.49 (8), p.461-463</ispartof><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3</citedby><cites>FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8204751$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>DRUMMOND, T. J</creatorcontrib><creatorcontrib>ZIPPERIAN, T. E</creatorcontrib><creatorcontrib>FRITZ, I. J</creatorcontrib><creatorcontrib>SCHIRBER, J. E</creatorcontrib><creatorcontrib>PLUT, T. A</creatorcontrib><title>p-channel strained quantum well, field-effect transistor</title><title>Applied physics letters</title><description>A p-channel field-effect transistor with a 3.5 μm Cr/Au gate was fabricated from a modulation-doped GaAs/In0.2Ga0.8As/GaAs quantum well structure. Well-behaved transistor action was observed at both 300 and 77 K with extrinsic transconductances of 6.2 and 11.3 mS/mm, respectively. Shubnikov–deHaas measurements prove the existence of a two-dimensional hole gas with a strain-shifted light-hole ground state associated with a light-hole mass of 0.154m0.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Transistors</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNqN0E1LxDAQBuAgCq6r-Bd6EL2YdSZpk_Qoy_oBC170HKZpgpVuu5u0iP_e6i6ePQ0DDy8zL2OXCAsEJe9wUWpEdcRmCFpziWiO2QwAJFdlgafsLKWPaS2ElDNmtty9U9f5NktDpKbzdbYbqRvGTfbp2_Y2C41va-5D8G7IJtKlJg19PGcngdrkLw5zzt4eVq_LJ75-eXxe3q-5kwYGLrwMwkAoC2cqowzpXNS10mRkFcjlHjFHXXpRm-CIlNM5FM4RVEqAq4Kcs-t97jb2u9GnwW6a5KbLqPP9mKzI0QBq8x-ojVY4wZs9dLFPKfpgt7HZUPyyCPanQov2t8JJXh0iKTlqw_S8a9IfNwJyXaD8Bjlrbyk</recordid><startdate>19860825</startdate><enddate>19860825</enddate><creator>DRUMMOND, T. J</creator><creator>ZIPPERIAN, T. E</creator><creator>FRITZ, I. J</creator><creator>SCHIRBER, J. E</creator><creator>PLUT, T. A</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>19860825</creationdate><title>p-channel strained quantum well, field-effect transistor</title><author>DRUMMOND, T. J ; ZIPPERIAN, T. E ; FRITZ, I. J ; SCHIRBER, J. E ; PLUT, T. A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>DRUMMOND, T. J</creatorcontrib><creatorcontrib>ZIPPERIAN, T. E</creatorcontrib><creatorcontrib>FRITZ, I. J</creatorcontrib><creatorcontrib>SCHIRBER, J. E</creatorcontrib><creatorcontrib>PLUT, T. A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>DRUMMOND, T. J</au><au>ZIPPERIAN, T. E</au><au>FRITZ, I. J</au><au>SCHIRBER, J. E</au><au>PLUT, T. A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>p-channel strained quantum well, field-effect transistor</atitle><jtitle>Applied physics letters</jtitle><date>1986-08-25</date><risdate>1986</risdate><volume>49</volume><issue>8</issue><spage>461</spage><epage>463</epage><pages>461-463</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>A p-channel field-effect transistor with a 3.5 μm Cr/Au gate was fabricated from a modulation-doped GaAs/In0.2Ga0.8As/GaAs quantum well structure. Well-behaved transistor action was observed at both 300 and 77 K with extrinsic transconductances of 6.2 and 11.3 mS/mm, respectively. Shubnikov–deHaas measurements prove the existence of a two-dimensional hole gas with a strain-shifted light-hole ground state associated with a light-hole mass of 0.154m0.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.97116</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6951 |
ispartof | Applied physics letters, 1986-08, Vol.49 (8), p.461-463 |
issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_proquest_miscellaneous_24180178 |
source | AIP Digital Archive |
subjects | Applied sciences Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
title | p-channel strained quantum well, field-effect transistor |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T23%3A56%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=p-channel%20strained%20quantum%20well,%20field-effect%20transistor&rft.jtitle=Applied%20physics%20letters&rft.au=DRUMMOND,%20T.%20J&rft.date=1986-08-25&rft.volume=49&rft.issue=8&rft.spage=461&rft.epage=463&rft.pages=461-463&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.97116&rft_dat=%3Cproquest_cross%3E24180178%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c380t-2e3f280f95c8b868a742dd67a83bfac4e114179e2d8fcaa6c7405cca0b620cbf3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=24178761&rft_id=info:pmid/&rfr_iscdi=true |