Loading…

Temperature and intensity dependence of photorefractive effect in GaAs

The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295-386 K) and intensity (0.15-98 mW/sq cm of 1.15-micron light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates ra...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1986-11, Vol.49 (21), p.1456-1458
Main Authors: Cheng, Li-Jen, Partovi, Afshin
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23
cites cdi_FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23
container_end_page 1458
container_issue 21
container_start_page 1456
container_title Applied physics letters
container_volume 49
creator Cheng, Li-Jen
Partovi, Afshin
description The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295-386 K) and intensity (0.15-98 mW/sq cm of 1.15-micron light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates rapidly over a narrow range of temperature as temperature rises, and that this characteristic temperature increases with the logarithm of beam intensity. The observed phenomenon is attributed to the competing effects of the dark- and light-induced conductivities.
doi_str_mv 10.1063/1.97301
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_24338429</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24338429</sourcerecordid><originalsourceid>FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23</originalsourceid><addsrcrecordid>eNo9kE9LAzEQxYMoWKv4BTzsQfS0NX83u8dSbBUKXuo5zGYnuNJm1yQV-u2NtggzDAM_3rx5hNwyOmO0Ek9s1mhB2RmZMKp1KRirz8mEUirKqlHsklzF-JlXxYWYkOUGdyMGSPuABfiu6H1CH_t0KDoc0XfoLRaDK8aPIQ0BXQCb-m8s0Dm0KePFCubxmlw42Ea8Oc0peV8-bxYv5fpt9bqYr0srqEylZjaXAucoVxQ0k9Ch4p1lUoEUiLJrRdvoVosGq9wOVOdalLKtK-e4mJKHo-4Yhq89xmR2fbS43YLHYR8Nl0LUkjcZfDyCNgwxZt9mDP0OwsEwan5zMsz85ZTJ-5MkRAvb_KC3ffzHa64Yr34v3x0xDxGMTyEa1tQ6x1rVtRQ_9CpvmA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24338429</pqid></control><display><type>article</type><title>Temperature and intensity dependence of photorefractive effect in GaAs</title><source>AIP Digital Archive</source><creator>Cheng, Li-Jen ; Partovi, Afshin</creator><creatorcontrib>Cheng, Li-Jen ; Partovi, Afshin</creatorcontrib><description>The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295-386 K) and intensity (0.15-98 mW/sq cm of 1.15-micron light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates rapidly over a narrow range of temperature as temperature rises, and that this characteristic temperature increases with the logarithm of beam intensity. The observed phenomenon is attributed to the competing effects of the dark- and light-induced conductivities.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.97301</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Legacy CDMS: American Institute of Physics</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of bulk materials and thin films ; Physics ; Solid-State Physics</subject><ispartof>Applied physics letters, 1986-11, Vol.49 (21), p.1456-1458</ispartof><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23</citedby><cites>FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=8251262$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Cheng, Li-Jen</creatorcontrib><creatorcontrib>Partovi, Afshin</creatorcontrib><title>Temperature and intensity dependence of photorefractive effect in GaAs</title><title>Applied physics letters</title><description>The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295-386 K) and intensity (0.15-98 mW/sq cm of 1.15-micron light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates rapidly over a narrow range of temperature as temperature rises, and that this characteristic temperature increases with the logarithm of beam intensity. The observed phenomenon is attributed to the competing effects of the dark- and light-induced conductivities.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of bulk materials and thin films</subject><subject>Physics</subject><subject>Solid-State Physics</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNo9kE9LAzEQxYMoWKv4BTzsQfS0NX83u8dSbBUKXuo5zGYnuNJm1yQV-u2NtggzDAM_3rx5hNwyOmO0Ek9s1mhB2RmZMKp1KRirz8mEUirKqlHsklzF-JlXxYWYkOUGdyMGSPuABfiu6H1CH_t0KDoc0XfoLRaDK8aPIQ0BXQCb-m8s0Dm0KePFCubxmlw42Ea8Oc0peV8-bxYv5fpt9bqYr0srqEylZjaXAucoVxQ0k9Ch4p1lUoEUiLJrRdvoVosGq9wOVOdalLKtK-e4mJKHo-4Yhq89xmR2fbS43YLHYR8Nl0LUkjcZfDyCNgwxZt9mDP0OwsEwan5zMsz85ZTJ-5MkRAvb_KC3ffzHa64Yr34v3x0xDxGMTyEa1tQ6x1rVtRQ_9CpvmA</recordid><startdate>19861124</startdate><enddate>19861124</enddate><creator>Cheng, Li-Jen</creator><creator>Partovi, Afshin</creator><general>American Institute of Physics</general><scope>CYE</scope><scope>CYI</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19861124</creationdate><title>Temperature and intensity dependence of photorefractive effect in GaAs</title><author>Cheng, Li-Jen ; Partovi, Afshin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of bulk materials and thin films</topic><topic>Physics</topic><topic>Solid-State Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cheng, Li-Jen</creatorcontrib><creatorcontrib>Partovi, Afshin</creatorcontrib><collection>NASA Scientific and Technical Information</collection><collection>NASA Technical Reports Server</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cheng, Li-Jen</au><au>Partovi, Afshin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature and intensity dependence of photorefractive effect in GaAs</atitle><jtitle>Applied physics letters</jtitle><date>1986-11-24</date><risdate>1986</risdate><volume>49</volume><issue>21</issue><spage>1456</spage><epage>1458</epage><pages>1456-1458</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295-386 K) and intensity (0.15-98 mW/sq cm of 1.15-micron light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates rapidly over a narrow range of temperature as temperature rises, and that this characteristic temperature increases with the logarithm of beam intensity. The observed phenomenon is attributed to the competing effects of the dark- and light-induced conductivities.</abstract><cop>Legacy CDMS</cop><pub>American Institute of Physics</pub><doi>10.1063/1.97301</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 1986-11, Vol.49 (21), p.1456-1458
issn 0003-6951
1077-3118
language eng
recordid cdi_proquest_miscellaneous_24338429
source AIP Digital Archive
subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Physics
Solid-State Physics
title Temperature and intensity dependence of photorefractive effect in GaAs
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T23%3A52%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature%20and%20intensity%20dependence%20of%20photorefractive%20effect%20in%20GaAs&rft.jtitle=Applied%20physics%20letters&rft.au=Cheng,%20Li-Jen&rft.date=1986-11-24&rft.volume=49&rft.issue=21&rft.spage=1456&rft.epage=1458&rft.pages=1456-1458&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.97301&rft_dat=%3Cproquest_cross%3E24338429%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c304t-71c71c5aff0250a714ade52dc145a43ee4db3b97b739e639efa5dfbe44b86ff23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=24338429&rft_id=info:pmid/&rfr_iscdi=true