Optically monitored electrodeposition of thin CdSe films

Interference in the light reflected from a semiconducting non-oxide film was observed for the first time during the electrodeposition of CdSe. The in situ experimental curve was compared with that calculated using Fresnel's equations, which were modified to take into account the non-unformity o...

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Bibliographic Details
Published in:Thin solid films 1987-03, Vol.147 (3), p.291-297
Main Authors: Fracastoro-Decker, Maristella, Ferreira, Jorge L.S., Gomes, Neidenêi V., Decker, Franco
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Interference in the light reflected from a semiconducting non-oxide film was observed for the first time during the electrodeposition of CdSe. The in situ experimental curve was compared with that calculated using Fresnel's equations, which were modified to take into account the non-unformity of the film.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(87)90025-3