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Thermal and Dielectric Measurements in MgO and Al sub 2 O sub 3
Based on differential thermal analysis between 20-1200 deg C, measurements of the stored energy induced in MgO and Al sub 2 O sub 3 by either electron irradiation or quenching are presented. Thermoluminescence measurements have also been made to study the types of defects involved in these energy re...
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Published in: | Journal of nuclear materials 1987-10, Vol.155-157A, p.352-356 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Online Access: | Get full text |
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Summary: | Based on differential thermal analysis between 20-1200 deg C, measurements of the stored energy induced in MgO and Al sub 2 O sub 3 by either electron irradiation or quenching are presented. Thermoluminescence measurements have also been made to study the types of defects involved in these energy release processes. Some data are also shown from thermally stimulated depolarization measurements, related to dipolar relaxations which affect to RF absorption processes. 14 ref.--AA |
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ISSN: | 0022-3115 |