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Tensile behavior of Pb-Sn solder/Cu joints
Solders of nominal 95Pb--5Sn and 60Sn--40Pb were used to join Cu plates. The effect of ternary additions of indium, Ag, Sb, and bismuth to the near-eutectic solder were also investigated. Bulk solder and interfacial joint microstructures were characterized for each solder alloy. The solder joints we...
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Published in: | Journal of electronic materials 1987-05, Vol.16 (3), p.203-208 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Solders of nominal 95Pb--5Sn and 60Sn--40Pb were used to join Cu plates. The effect of ternary additions of indium, Ag, Sb, and bismuth to the near-eutectic solder were also investigated. Bulk solder and interfacial joint microstructures were characterized for each solder alloy. The solder joints were strained to failure in tension; joint strength and failure mode were determined. 95Pb--5Sn/Cu and 60Sn--40Pb/Cu specimens were tested both as-processed and after reflow. 95Pb--5Sn/Cu as-processed and reflow specimens failed in tension in a ductile mode. Voids initiated at beta -Sn precipitates in the as-processed specimens and at the Cu sub 3 Sn intermetallic in both the reflow specimens. 60Sn--40Pb/Cu failed transgranularly through the Cu sub 6 Sn sub 5 intermetallic in both the as-processed and reflow conditions. The joint tensile strength of the reflow specimens was approximately half that of the as-processed specimens for both the high-Pb and near-eutectic alloys. The Cu sub 6 Sn sub 5 intermetallic dominated the tensile failure mode of the near-eutectic solder/Cu joints. The fracture path of the near-eutectic alloys with ternary additions depended on the presence of Cu sub 6 Sn sub 5 rods in the solder within the Cu plates. Specimens with ternary additions of In and Ag contained only interfacial intermetallics and exhibited interfacial failure at the Cu sub 6 Sn sub 5 . Joints manufactured with ternary additions of Sb and Bi contained rods of Cu sub 6 Sn sub 5 within the solder. Tensile failure of the Sb and Bi specimens occurred through the solder at the Cu sub 6 Sn sub 5 rods. 7 ref.--AA |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/BF02655488 |