'Oxide-free' tip for scanning tunneling microscopy

A new tip for scanning tunneling microscopy and a tip repair procedure that allows one to reproducibly obtain atomic images of highly oriented pyrolytic graphite with previously inoperable tips are reported. The tips are shown to be relatively oxide-free and highly resistant to oxidation. The tips a...

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Bibliographic Details
Published in:Applied physics letters 1987-08, Vol.51 (5), p.305-307
Main Authors: Colton, R. J., Baker, S. M., Baldeschwieler, J. D., Kaiser, W. J.
Format: Article
Language:English
Subjects:
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instrumentation And Photography
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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Summary:A new tip for scanning tunneling microscopy and a tip repair procedure that allows one to reproducibly obtain atomic images of highly oriented pyrolytic graphite with previously inoperable tips are reported. The tips are shown to be relatively oxide-free and highly resistant to oxidation. The tips are fabricated with graphite by two distinct methods.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.98451