Examination of carbon inclusions in sintered silicon carbide

Particles of excess carbon are a general feature in the microstructure of sintered SiC. This phenomenon was studied by high resolution Auger electron spectroscopy on UHV-exposed fracture surfaces of (B, C)- and (Al, C)-doped materials. Normally the inclusions are about 1–2 μm in diameter, but partic...

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Bibliographic Details
Published in:International journal of high technology ceramics 1987, Vol.3 (2), p.129-141
Main Authors: Hamminger, R., Grathwohl, G., Thümmler, F.
Format: Article
Language:English
Subjects:
Applied sciences
Building materials. Ceramics. Glasses
Chemical industry and chemicals
Exact sciences and technology
Refractory products
Special refractories
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Summary:Particles of excess carbon are a general feature in the microstructure of sintered SiC. This phenomenon was studied by high resolution Auger electron spectroscopy on UHV-exposed fracture surfaces of (B, C)- and (Al, C)-doped materials. Normally the inclusions are about 1–2 μm in diameter, but particles of about 10–20 μm are also observed. The inclusions contain free carbon or carbon together with significant accompanying elements and phases, which were found to be characteristic for each particular material. The analytical results are briefly discussed with respect to processing and their impact on materials properties.
ISSN:0267-3762
1878-2892
DOI:10.1016/0267-3762(87)90033-6