Diffraction Studies of Structure in Two Iron Multilayers

X-ray studies of sputtered Fe--V and Fe--Si LMS as a function of Fe layer thickness were used to determine the structure perpendicular to the layers. These studies showed the types of behavior expected of LMS and were generally consistent with results from existing previous studies. Electron diffrac...

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Bibliographic Details
Published in:Ultramicroscopy 1988-05, Vol.29 (1-4), p.80-87
Main Author: Foiles, C L
Format: Article
Language:English
Online Access:Get full text
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Summary:X-ray studies of sputtered Fe--V and Fe--Si LMS as a function of Fe layer thickness were used to determine the structure perpendicular to the layers. These studies showed the types of behavior expected of LMS and were generally consistent with results from existing previous studies. Electron diffraction studies were used to obtain information about the in-plane structure of these LMS. For each system specific forms of in-plane structure developed as the Fe layer thickness decreased. The superlattice system Fe--V developed a common BCC lattice for t sub Fe < = 25 A. The Fe--Si system showed a loss of long-range order as t sub Fe decreased; however, a simple transition from crystalline to amorphous form does not correctly describe this loss of order. 10 ref.--AA
ISSN:0304-3991