Loading…

Growth kinetics of silicon carbide CVD

In CVD growth of silicon carbide on graphite substrates, the growth rate has been increased by the use of a thick intermediate layer. Before the CVD, the intermediate layer is simply deposited by the partial pressure control of the source gas in the same chamber. The intermediate layer of a few micr...

Full description

Saved in:
Bibliographic Details
Published in:Journal of crystal growth 1988-09, Vol.91 (4), p.599-604
Main Authors: Kaneko, Tsutomu, Okuno, Takashi, Yumoto, Hisami
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3
cites cdi_FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3
container_end_page 604
container_issue 4
container_start_page 599
container_title Journal of crystal growth
container_volume 91
creator Kaneko, Tsutomu
Okuno, Takashi
Yumoto, Hisami
description In CVD growth of silicon carbide on graphite substrates, the growth rate has been increased by the use of a thick intermediate layer. Before the CVD, the intermediate layer is simply deposited by the partial pressure control of the source gas in the same chamber. The intermediate layer of a few micrometers affects the CVD layer thickness of several tens of micrometers and makes the growth rate approximately double in the case of the source gases, dimethyl-dichloro-silane (DDS) and hydrogen. The temperature dependence of the growth rates indicates that the surface growth kinetics change.
doi_str_mv 10.1016/0022-0248(88)90127-3
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_24897688</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0022024888901273</els_id><sourcerecordid>24897688</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3</originalsourceid><addsrcrecordid>eNp9kLFOwzAQhi0EEqXwBgwZUAVD4Gwnjr0goQIFqRILsFqOcxGGNC52CuLtcWnVkemG-_47fT8hpxQuKVBxBcBYDqyQ51JeKKCsyvkeGVFZ8bxMy30y2iGH5CjGd4CUozAik1nw38Nb9uF6HJyNmW-z6DpnfZ9ZE2rXYDZ9vT0mB63pIp5s55i83N89Tx_y-dPscXozzy0XxZBTWquSc0kNlsJIVlumKBRNC20taqwAVFkqWbBCoZKMV0pAoxSrGRjDZMPHZLK5uwz-c4Vx0AsXLXad6dGvok4CqhJSJrDYgDb4GAO2ehncwoQfTUGvS9FrY7021lLqv1I0T7Gz7X0TrenaYHrr4i5bcUqpKBN2vcEwuX45DDpah73FxgW0g268-__PLwsccfA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24897688</pqid></control><display><type>article</type><title>Growth kinetics of silicon carbide CVD</title><source>Backfile Package - Materials Science [YMS]</source><source>Backfile Package - Physics General (Legacy) [YPA]</source><creator>Kaneko, Tsutomu ; Okuno, Takashi ; Yumoto, Hisami</creator><creatorcontrib>Kaneko, Tsutomu ; Okuno, Takashi ; Yumoto, Hisami</creatorcontrib><description>In CVD growth of silicon carbide on graphite substrates, the growth rate has been increased by the use of a thick intermediate layer. Before the CVD, the intermediate layer is simply deposited by the partial pressure control of the source gas in the same chamber. The intermediate layer of a few micrometers affects the CVD layer thickness of several tens of micrometers and makes the growth rate approximately double in the case of the source gases, dimethyl-dichloro-silane (DDS) and hydrogen. The temperature dependence of the growth rates indicates that the surface growth kinetics change.</description><identifier>ISSN: 0022-0248</identifier><identifier>EISSN: 1873-5002</identifier><identifier>DOI: 10.1016/0022-0248(88)90127-3</identifier><identifier>CODEN: JCRGAE</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Methods of crystal growth; physics of crystal growth ; Physics ; Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation</subject><ispartof>Journal of crystal growth, 1988-09, Vol.91 (4), p.599-604</ispartof><rights>1988</rights><rights>1989 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3</citedby><cites>FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0022024888901273$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3555,3632,27924,27925,46004,46012</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=7311165$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kaneko, Tsutomu</creatorcontrib><creatorcontrib>Okuno, Takashi</creatorcontrib><creatorcontrib>Yumoto, Hisami</creatorcontrib><title>Growth kinetics of silicon carbide CVD</title><title>Journal of crystal growth</title><description>In CVD growth of silicon carbide on graphite substrates, the growth rate has been increased by the use of a thick intermediate layer. Before the CVD, the intermediate layer is simply deposited by the partial pressure control of the source gas in the same chamber. The intermediate layer of a few micrometers affects the CVD layer thickness of several tens of micrometers and makes the growth rate approximately double in the case of the source gases, dimethyl-dichloro-silane (DDS) and hydrogen. The temperature dependence of the growth rates indicates that the surface growth kinetics change.</description><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Methods of crystal growth; physics of crystal growth</subject><subject>Physics</subject><subject>Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation</subject><issn>0022-0248</issn><issn>1873-5002</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1988</creationdate><recordtype>article</recordtype><recordid>eNp9kLFOwzAQhi0EEqXwBgwZUAVD4Gwnjr0goQIFqRILsFqOcxGGNC52CuLtcWnVkemG-_47fT8hpxQuKVBxBcBYDqyQ51JeKKCsyvkeGVFZ8bxMy30y2iGH5CjGd4CUozAik1nw38Nb9uF6HJyNmW-z6DpnfZ9ZE2rXYDZ9vT0mB63pIp5s55i83N89Tx_y-dPscXozzy0XxZBTWquSc0kNlsJIVlumKBRNC20taqwAVFkqWbBCoZKMV0pAoxSrGRjDZMPHZLK5uwz-c4Vx0AsXLXad6dGvok4CqhJSJrDYgDb4GAO2ehncwoQfTUGvS9FrY7021lLqv1I0T7Gz7X0TrenaYHrr4i5bcUqpKBN2vcEwuX45DDpah73FxgW0g268-__PLwsccfA</recordid><startdate>19880901</startdate><enddate>19880901</enddate><creator>Kaneko, Tsutomu</creator><creator>Okuno, Takashi</creator><creator>Yumoto, Hisami</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19880901</creationdate><title>Growth kinetics of silicon carbide CVD</title><author>Kaneko, Tsutomu ; Okuno, Takashi ; Yumoto, Hisami</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1988</creationdate><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Methods of crystal growth; physics of crystal growth</topic><topic>Physics</topic><topic>Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kaneko, Tsutomu</creatorcontrib><creatorcontrib>Okuno, Takashi</creatorcontrib><creatorcontrib>Yumoto, Hisami</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of crystal growth</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kaneko, Tsutomu</au><au>Okuno, Takashi</au><au>Yumoto, Hisami</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth kinetics of silicon carbide CVD</atitle><jtitle>Journal of crystal growth</jtitle><date>1988-09-01</date><risdate>1988</risdate><volume>91</volume><issue>4</issue><spage>599</spage><epage>604</epage><pages>599-604</pages><issn>0022-0248</issn><eissn>1873-5002</eissn><coden>JCRGAE</coden><abstract>In CVD growth of silicon carbide on graphite substrates, the growth rate has been increased by the use of a thick intermediate layer. Before the CVD, the intermediate layer is simply deposited by the partial pressure control of the source gas in the same chamber. The intermediate layer of a few micrometers affects the CVD layer thickness of several tens of micrometers and makes the growth rate approximately double in the case of the source gases, dimethyl-dichloro-silane (DDS) and hydrogen. The temperature dependence of the growth rates indicates that the surface growth kinetics change.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/0022-0248(88)90127-3</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0022-0248
ispartof Journal of crystal growth, 1988-09, Vol.91 (4), p.599-604
issn 0022-0248
1873-5002
language eng
recordid cdi_proquest_miscellaneous_24897688
source Backfile Package - Materials Science [YMS]; Backfile Package - Physics General (Legacy) [YPA]
subjects Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of crystal growth
physics of crystal growth
Physics
Theory and models of crystal growth
physics of crystal growth, crystal morphology and orientation
title Growth kinetics of silicon carbide CVD
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T06%3A30%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Growth%20kinetics%20of%20silicon%20carbide%20CVD&rft.jtitle=Journal%20of%20crystal%20growth&rft.au=Kaneko,%20Tsutomu&rft.date=1988-09-01&rft.volume=91&rft.issue=4&rft.spage=599&rft.epage=604&rft.pages=599-604&rft.issn=0022-0248&rft.eissn=1873-5002&rft.coden=JCRGAE&rft_id=info:doi/10.1016/0022-0248(88)90127-3&rft_dat=%3Cproquest_cross%3E24897688%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c364t-11b953381ae56a82bc29104df0fb6be700955984249e98237960d992b20aa28d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=24897688&rft_id=info:pmid/&rfr_iscdi=true