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High-power, very low threshold, GaInP/AlGaInP visible diode lasers
Visible light (665 nm) laser diodes employing a strained-layer, single quantum well, graded index separate confinement heterostructure were fabricated from epitaxial wafers grown by metalorganic chemical vapor deposition. Threshold current densities for single element, uncoated, broad-area diodes op...
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Published in: | Applied physics letters 1991-06, Vol.58 (22), p.2464-2466 |
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container_end_page | 2466 |
container_issue | 22 |
container_start_page | 2464 |
container_title | Applied physics letters |
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creator | SERREZE, H. B CHEN, Y. C WATERS, R. G |
description | Visible light (665 nm) laser diodes employing a strained-layer, single quantum well, graded index separate confinement heterostructure were fabricated from epitaxial wafers grown by metalorganic chemical vapor deposition. Threshold current densities for single element, uncoated, broad-area diodes operated cw as low as 425 A/cm2, cw power outputs of 340 mW per facet, and pulsed outputs (100 μs pulse width) of slightly under 1 W per facet were achieved. These power output values are believed to be the highest reported to date for visible light diode lasers, and this cw threshold current density is believed to be, by far, the lowest. |
doi_str_mv | 10.1063/1.104845 |
format | article |
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B</creatorcontrib><creatorcontrib>CHEN, Y. C</creatorcontrib><creatorcontrib>WATERS, R. G</creatorcontrib><title>High-power, very low threshold, GaInP/AlGaInP visible diode lasers</title><title>Applied physics letters</title><description>Visible light (665 nm) laser diodes employing a strained-layer, single quantum well, graded index separate confinement heterostructure were fabricated from epitaxial wafers grown by metalorganic chemical vapor deposition. Threshold current densities for single element, uncoated, broad-area diodes operated cw as low as 425 A/cm2, cw power outputs of 340 mW per facet, and pulsed outputs (100 μs pulse width) of slightly under 1 W per facet were achieved. These power output values are believed to be the highest reported to date for visible light diode lasers, and this cw threshold current density is believed to be, by far, the lowest.</description><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Lasers</subject><subject>Optics</subject><subject>Physics</subject><subject>Semiconductor lasers; laser diodes</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo9kM1KAzEURoMoWKvgI2Qh4qJjk0kykyxr0bZQ0IWuQyZzYyNpU5P-0Ld3tMXV4cLhcPkQuqXkkZKKDWkHLrk4Qz1K6rpglMpz1COEsKJSgl6iq5y_ulOUjPXQ09R_Lop13EMa4B2kAw5xjzeLBHkRQzvAEzNbvQ1H4Y9457NvAuDWxxZwMBlSvkYXzoQMNyf20cfL8_t4WsxfJ7PxaF5YJuimqBqiStdwyRw3LTRKlpYKbonkzIFwzioqFOWudmCgKQUhVdtwwaisuere76P7Y3ed4vcW8kYvfbYQgllB3GZdciVkl-_Eh6NoU8w5gdPr5JcmHTQl-nckTfVxpE69OzVNtia4ZFbW53-fq7qWirAfupVjzw</recordid><startdate>19910603</startdate><enddate>19910603</enddate><creator>SERREZE, H. 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G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c351t-6b092fb483f4adeb982c154c0843fe5ffc915914f7feaeb25006db45318749003</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Lasers</topic><topic>Optics</topic><topic>Physics</topic><topic>Semiconductor lasers; laser diodes</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SERREZE, H. B</creatorcontrib><creatorcontrib>CHEN, Y. C</creatorcontrib><creatorcontrib>WATERS, R. G</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SERREZE, H. B</au><au>CHEN, Y. C</au><au>WATERS, R. G</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-power, very low threshold, GaInP/AlGaInP visible diode lasers</atitle><jtitle>Applied physics letters</jtitle><date>1991-06-03</date><risdate>1991</risdate><volume>58</volume><issue>22</issue><spage>2464</spage><epage>2466</epage><pages>2464-2466</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Visible light (665 nm) laser diodes employing a strained-layer, single quantum well, graded index separate confinement heterostructure were fabricated from epitaxial wafers grown by metalorganic chemical vapor deposition. Threshold current densities for single element, uncoated, broad-area diodes operated cw as low as 425 A/cm2, cw power outputs of 340 mW per facet, and pulsed outputs (100 μs pulse width) of slightly under 1 W per facet were achieved. These power output values are believed to be the highest reported to date for visible light diode lasers, and this cw threshold current density is believed to be, by far, the lowest.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.104845</doi><tpages>3</tpages></addata></record> |
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language | eng |
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source | AIP Digital Archive |
subjects | Exact sciences and technology Fundamental areas of phenomenology (including applications) Lasers Optics Physics Semiconductor lasers laser diodes |
title | High-power, very low threshold, GaInP/AlGaInP visible diode lasers |
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