Surface analysis: X-ray photoelectric spectroscopy and Auger electron spectroscopy

Papers of 1987-1989 are reviewed. Topics included are binding energies, spectral features, data handling, polymers, sample degradation, small particle analysis, line shapes, instrumentation, beam interactions, backscattering, sensitivity factors, depth profiling, quantitative analysis, background co...

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Bibliographic Details
Published in:Analytical chemistry (Washington) 1990-01, Vol.62 (12), p.113-25R
Main Author: Turner, Noel H
Format: Article
Language:English
Online Access:Get full text
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Summary:Papers of 1987-1989 are reviewed. Topics included are binding energies, spectral features, data handling, polymers, sample degradation, small particle analysis, line shapes, instrumentation, beam interactions, backscattering, sensitivity factors, depth profiling, quantitative analysis, background correction, angular effects, and inelastic mean free paths. 332 refs.
ISSN:0003-2700