The Determination of the Structure and Composition at Interfaces to Atomic Resolution

The prediction of the properties of modern multilayered systems e.g. Cu--Ni/Pd, provides a challenge to the accuracy to which the structure of a boundary can be characterised using the transmission electron microscope (TEM). A variety of new ways of using the TEM have recently been developed in this...

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Bibliographic Details
Published in:Ultramicroscopy 1988-05, Vol.29 (1-4), p.18-30
Main Authors: Boothroyd, C B, Baxter, C S, Bithell, E G
Format: Article
Language:English
Online Access:Get full text
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Summary:The prediction of the properties of modern multilayered systems e.g. Cu--Ni/Pd, provides a challenge to the accuracy to which the structure of a boundary can be characterised using the transmission electron microscope (TEM). A variety of new ways of using the TEM have recently been developed in this context, and some of the approaches which are now being applied are described. Particular emphasis is given to a description of the strengths and weaknesses of the Fresnel method in its potentially broad application to compositional analysis. 33 ref.--AA
ISSN:0304-3991