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Object-dependent spatial resolution of the reflection-mode terahertz solid immersion microscopy
Terahertz (THz) solid immersion microscopy is a novel promising THz imaging modality that overcomes the Abbe diffraction limit. In our prior work, an original reflection-mode THz solid immersion microscope system with the resolution of 0.15λ (in free space) was demonstrated and used for imaging of s...
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Published in: | Optics express 2021-02, Vol.29 (3), p.3553-3566 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Terahertz (THz) solid immersion microscopy is a novel promising THz imaging modality that overcomes the Abbe diffraction limit. In our prior work, an original reflection-mode THz solid immersion microscope system with the resolution of 0.15λ (in free space) was demonstrated and used for imaging of soft biological tissues. In this paper, a numerical analysis, using the finite-difference time-domain technique, and an experimental study, using a set of objects with distinct refractive indexes, were performed in order to uncover, for the first time, the object-dependent spatial resolution of the THz solid immersion microscopy. Our findings revealed that the system resolution remains strongly sub-wavelength 0.15-0.4λ for the wide range of sample refractive indices n = 1.0-5.0 and absorption coefficients α = 0-400 cm
(by power). Considering these findings, two distinct regimes of the THz solid immersion microscopy were identified. First is the total internal reflection regime that takes place when the sample refractive index is relatively low, while the sub-wavelength resolution is enabled by both the evanescent and ordinary reflected waves at the interface between a high-refractive-index material and an imaged object. Second is the ordinary reflection regime that occurs when the sample refractive index is high enough, so that there is no more total internal reflection at the interface, while only the ordinary reflected waves inside a high-refractive-index material are responsible for the sub-wavelength resolution. The resultant conclusions are general and can be applied for analysis of solid immersion lenses operating in other spectral ranges, such as visible and infrared, given linear nature of the Maxwell's equations. |
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ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.415049 |