The calculation equations of characteristic fluorescence for multi-layer films

A calculation method is developed for the fluorescence radiation produced in an element by the characteristic X-ray emitted from another element in multi-layer films. The equations, applicable to a thin or a thick layer, are presented to facilitate X-ray analysis on a wide range of systems. An exten...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 1988-07, Vol.21 (7), p.1221-1225
Main Authors: Youhua, Hu, Yuencai, He, Jiaguang, Chen
Format: Article
Language:English
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Summary:A calculation method is developed for the fluorescence radiation produced in an element by the characteristic X-ray emitted from another element in multi-layer films. The equations, applicable to a thin or a thick layer, are presented to facilitate X-ray analysis on a wide range of systems. An extension of the equations to include multi-layer multi-component films is described. Samples are of Sn on Fe, and Au on Ni. 9 ref.--AA
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/21/7/026