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The Stellar X-ray Polarimeter - A focal plane polarimeter for the Spectrum X-Gamma mission
This paper describes an X-ray polarimeter that will be flown on the Spectrum X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson scattering from a metallic lithium target, and photoemission from a cesiu...
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Published in: | Optical Engineering 1990-07, Vol.29 (7), p.773-780 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | This paper describes an X-ray polarimeter that will be flown on the Spectrum X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson scattering from a metallic lithium target, and photoemission from a cesium iodide photocathode. These three methods allow polarization measurements over an energy band from 0.3 to 12 keV. The polarimeter will make possible sensitive measurements of several hundred known X-ray sources. X-ray polarization measurements will make it possible to constrain the geometry of gas flow in X-ray binaries, identify nonthermal emission in supernova remnants, test current models for X-ray emission in radio pulsars, determine the radiation mechanisms in active galactic nuclei, and search for inertial frame dragging (Lense-Thirring effect) around the putative black hole in Cygnus X-1. |
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ISSN: | 0091-3286 1560-2303 |
DOI: | 10.1117/12.55660 |