A WSI approach towards defect/fault-tolerant reconfigurable serial systems

A superchip for realizing ultra-large-scale integrated (ULSI) systems based on a wafer-scale integrated (WSI) circuit concept, which incorporates defect/fault tolerance and system reconfiguration, is introduced. The key features of the central architectural component, a large crossbar switch matrix,...

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Bibliographic Details
Published in:IEEE journal of solid-state circuits 1988-06, Vol.23 (3), p.639-646
Main Authors: Chen, W., Mavor, J., Denyer, P.B., Renshaw, D.
Format: Article
Language:English
Subjects:
Circuit testing
Communication switching
Fault tolerant systems
Integrated circuit technology
Prototypes
Routing
Switches
Switching circuits
Transmission line matrix methods
Ultra large scale integration
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Summary:A superchip for realizing ultra-large-scale integrated (ULSI) systems based on a wafer-scale integrated (WSI) circuit concept, which incorporates defect/fault tolerance and system reconfiguration, is introduced. The key features of the central architectural component, a large crossbar switch matrix, are described. A prototype has been fabricated in silicon technology. Hypothetical processor examples demonstrate the power of the superchip approach, and design/performance figures are discussed.< >
ISSN:0018-9200
1558-173X
DOI:10.1109/4.301