XPS Studies of 80K-Phase Bi--Sr--Ca--Cu--O Single Crystals

The XPS (X-ray photoelectron spectroscopy) measurements of the 80K-phase Bi--Sr--Ca--Cu--O single crystals were carried out on surfaces obtained by cleaving in vacuum, by cleaving in air and heating in vacuum, and by Ar exp + sputter etching of the air-cleaved-and-heated surface. The chemical bond n...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics, Letters (Japan) Letters (Japan), 1990-03, Vol.29 (3), p.L438-L440
Main Authors: Kishida, S, Tokutaka, H, Toda, F, Fujimoto, H, Futo, W, Nishimori, K, Ishihara, N
Format: Article
Language:English
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Summary:The XPS (X-ray photoelectron spectroscopy) measurements of the 80K-phase Bi--Sr--Ca--Cu--O single crystals were carried out on surfaces obtained by cleaving in vacuum, by cleaving in air and heating in vacuum, and by Ar exp + sputter etching of the air-cleaved-and-heated surface. The chemical bond natures of all the constituent elements from the air-cleaved-and-heated surface are approximately equal to those from the vacuum-cleaved surface. Strontium and Ca from the sputtered surface are more oxidized than those from the vacuum-cleaved surface.
ISSN:0021-4922