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3-D surface solution using structured light and constraint propagation

A method for 3-D surface measurement using a projected grid of light is presented. The grid line identification problem is solved using very general constraints. At the same time, 3-D surface patch solutions are developed. From the general constraints of set of geometric and topological rules are de...

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Bibliographic Details
Published in:IEEE transactions on pattern analysis and machine intelligence 1989-04, Vol.11 (4), p.390-402
Main Authors: Hu, G., Stockman, G.
Format: Article
Language:English
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Summary:A method for 3-D surface measurement using a projected grid of light is presented. The grid line identification problem is solved using very general constraints. At the same time, 3-D surface patch solutions are developed. From the general constraints of set of geometric and topological rules are derived that are effectively applied in the computation of grid labels and hence 3-D surface solutions. A set of five algorithms has been applied on five real scenes consisting of multiple objects of arbitrary shapes. The results show that globally consistent surface solutions can be obtained rapidly with good accuracy using a single image. A small degree of ambiguity remains, but can be further reduced or removed using increased knowledge.< >
ISSN:0162-8828
1939-3539
2160-9292
DOI:10.1109/34.19035