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EXAFS study of alkali galliosilicate glasses
The extended X-ray absorption fine structure (EXAFS) of Na 2OGa 3SiO 2 glasses of 3 compositional series containing either a constant Na 2O or SiO 2 content, or a constant Ga/Na ratio of 1.0, analogous crystalline compounds and 4 potassium-containing glasses were measured on the SUNY X21 beamline...
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Published in: | Journal of non-crystalline solids 1988-10, Vol.105 (1), p.139-148 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The extended X-ray absorption fine structure (EXAFS) of Na
2OGa
3SiO
2 glasses of 3 compositional series containing either a constant Na
2O or SiO
2 content, or a constant Ga/Na ratio of 1.0, analogous crystalline compounds and 4 potassium-containing glasses were measured on the SUNY X21 beamline of the National Synchrotron Light Source at Brookhaven National Laboratory. The data were analyzed to extract Ga K-edge position, coordination numbers and GaO bond lengths for each glass composition. This study indicates that the GaO bond length is 1.83 Å, and that the coordination number of oxygen about gallium is constant at 4, regardless of glass composition. |
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ISSN: | 0022-3093 1873-4812 |
DOI: | 10.1016/0022-3093(88)90348-1 |