XANES and EXAFS in Cu-Ti and Ni-Zr glasses

X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu--Ti glasses and on the K-edges of Ni and Zr in Ni--Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape...

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Published in:Pramāṇa 1988-09, Vol.31 (3), p.233-240
Main Authors: Garg, K B, Jerath, K S, Chauhan, H S, Chandra, U, Singhal, R K, Rao, K V R
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Language:English
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cited_by cdi_FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453
cites cdi_FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453
container_end_page 240
container_issue 3
container_start_page 233
container_title Pramāṇa
container_volume 31
creator Garg, K B
Jerath, K S
Chauhan, H S
Chandra, U
Singhal, R K
Rao, K V R
description X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu--Ti glasses and on the K-edges of Ni and Zr in Ni--Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape shift and intensity of the absorption edge as well as the principal absorption maximum. The values of bondlength calculated by the one-electron multiple scattering XANES theory as well as the graphical analysis EXAFS technique show good agreement. 23 ref.--AA
doi_str_mv 10.1007/BF02848811
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_25118711</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25118711</sourcerecordid><originalsourceid>FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453</originalsourceid><addsrcrecordid>eNpFkE1Lw0AYhBdRsFYv_oKcPBRW981-5N1jDIkKpR5aoXgJm2RXImlSd5uD_77RCp5mGB4GZgi5BXYPjCUPjwWLUSACnJEZ0wmnCQCcT54zQUWM-pJchfDJGGjB5YwstukqX0emb6J8mxbrqO2jbKSb9jdatfTdRx-dCcGGa3LhTBfszZ_OyVuRb7Jnunx9esnSJa1jFR9olVS1ULY2qGWDDTLeOC25czxRDishrHRWC5gyVKhRqkYYJ5VQFdhKSD4nd6fevR--RhsO5a4Nte0609thDGUsAXCaNYGLE1j7IQRvXbn37c747xJY-XNH-X8HPwI8nE34</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25118711</pqid></control><display><type>article</type><title>XANES and EXAFS in Cu-Ti and Ni-Zr glasses</title><source>Indian Academy of Sciences</source><creator>Garg, K B ; Jerath, K S ; Chauhan, H S ; Chandra, U ; Singhal, R K ; Rao, K V R</creator><creatorcontrib>Garg, K B ; Jerath, K S ; Chauhan, H S ; Chandra, U ; Singhal, R K ; Rao, K V R</creatorcontrib><description>X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu--Ti glasses and on the K-edges of Ni and Zr in Ni--Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape shift and intensity of the absorption edge as well as the principal absorption maximum. The values of bondlength calculated by the one-electron multiple scattering XANES theory as well as the graphical analysis EXAFS technique show good agreement. 23 ref.--AA</description><identifier>ISSN: 0304-4289</identifier><identifier>EISSN: 0973-7111</identifier><identifier>DOI: 10.1007/BF02848811</identifier><language>eng</language><ispartof>Pramāṇa, 1988-09, Vol.31 (3), p.233-240</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453</citedby><cites>FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Garg, K B</creatorcontrib><creatorcontrib>Jerath, K S</creatorcontrib><creatorcontrib>Chauhan, H S</creatorcontrib><creatorcontrib>Chandra, U</creatorcontrib><creatorcontrib>Singhal, R K</creatorcontrib><creatorcontrib>Rao, K V R</creatorcontrib><title>XANES and EXAFS in Cu-Ti and Ni-Zr glasses</title><title>Pramāṇa</title><description>X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu--Ti glasses and on the K-edges of Ni and Zr in Ni--Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape shift and intensity of the absorption edge as well as the principal absorption maximum. The values of bondlength calculated by the one-electron multiple scattering XANES theory as well as the graphical analysis EXAFS technique show good agreement. 23 ref.--AA</description><issn>0304-4289</issn><issn>0973-7111</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1988</creationdate><recordtype>article</recordtype><recordid>eNpFkE1Lw0AYhBdRsFYv_oKcPBRW981-5N1jDIkKpR5aoXgJm2RXImlSd5uD_77RCp5mGB4GZgi5BXYPjCUPjwWLUSACnJEZ0wmnCQCcT54zQUWM-pJchfDJGGjB5YwstukqX0emb6J8mxbrqO2jbKSb9jdatfTdRx-dCcGGa3LhTBfszZ_OyVuRb7Jnunx9esnSJa1jFR9olVS1ULY2qGWDDTLeOC25czxRDishrHRWC5gyVKhRqkYYJ5VQFdhKSD4nd6fevR--RhsO5a4Nte0609thDGUsAXCaNYGLE1j7IQRvXbn37c747xJY-XNH-X8HPwI8nE34</recordid><startdate>19880901</startdate><enddate>19880901</enddate><creator>Garg, K B</creator><creator>Jerath, K S</creator><creator>Chauhan, H S</creator><creator>Chandra, U</creator><creator>Singhal, R K</creator><creator>Rao, K V R</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8G</scope><scope>JG9</scope></search><sort><creationdate>19880901</creationdate><title>XANES and EXAFS in Cu-Ti and Ni-Zr glasses</title><author>Garg, K B ; Jerath, K S ; Chauhan, H S ; Chandra, U ; Singhal, R K ; Rao, K V R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1988</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Garg, K B</creatorcontrib><creatorcontrib>Jerath, K S</creatorcontrib><creatorcontrib>Chauhan, H S</creatorcontrib><creatorcontrib>Chandra, U</creatorcontrib><creatorcontrib>Singhal, R K</creatorcontrib><creatorcontrib>Rao, K V R</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><jtitle>Pramāṇa</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Garg, K B</au><au>Jerath, K S</au><au>Chauhan, H S</au><au>Chandra, U</au><au>Singhal, R K</au><au>Rao, K V R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>XANES and EXAFS in Cu-Ti and Ni-Zr glasses</atitle><jtitle>Pramāṇa</jtitle><date>1988-09-01</date><risdate>1988</risdate><volume>31</volume><issue>3</issue><spage>233</spage><epage>240</epage><pages>233-240</pages><issn>0304-4289</issn><eissn>0973-7111</eissn><abstract>X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu--Ti glasses and on the K-edges of Ni and Zr in Ni--Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape shift and intensity of the absorption edge as well as the principal absorption maximum. The values of bondlength calculated by the one-electron multiple scattering XANES theory as well as the graphical analysis EXAFS technique show good agreement. 23 ref.--AA</abstract><doi>10.1007/BF02848811</doi><tpages>8</tpages></addata></record>
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0973-7111
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title XANES and EXAFS in Cu-Ti and Ni-Zr glasses
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T16%3A28%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=XANES%20and%20EXAFS%20in%20Cu-Ti%20and%20Ni-Zr%20glasses&rft.jtitle=Prama%CC%84n%CC%A3a&rft.au=Garg,%20K%20B&rft.date=1988-09-01&rft.volume=31&rft.issue=3&rft.spage=233&rft.epage=240&rft.pages=233-240&rft.issn=0304-4289&rft.eissn=0973-7111&rft_id=info:doi/10.1007/BF02848811&rft_dat=%3Cproquest_cross%3E25118711%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c262t-b7bc46eca895d8d803df953ff376f8b44e5fe9419538689856d4af5646b1eb453%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=25118711&rft_id=info:pmid/&rfr_iscdi=true