X‐ray luminosity time‐of‐flight spectrometer for laser‐produced plasmas

A simple and compact x‐ray luminosity time‐of‐flight spectrometer for measurements of the velocity distribution of highly charged ions in laser‐produced plasmas is presented. The spectrometer is based on making time‐ and space‐resolved measurements of x‐ray line emission from these ions in the expan...

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Bibliographic Details
Published in:Review of scientific instruments 1988-07, Vol.59 (7), p.1076-1080
Main Authors: Naik, P. A., Gupta, P. D., Kumbhare, S. R.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Physics
Physics of gases, plasmas and electric discharges
Physics of plasmas and electric discharges
Plasma diagnostic techniques and instrumentation
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Description
Summary:A simple and compact x‐ray luminosity time‐of‐flight spectrometer for measurements of the velocity distribution of highly charged ions in laser‐produced plasmas is presented. The spectrometer is based on making time‐ and space‐resolved measurements of x‐ray line emission from these ions in the expansion zone. Design, operation, and performance of this system are described. The spectrometer is useful in studying processes of interaction between highly charged ions and buffer gases, and nonthermal behavior of laser‐produced plasma expansion.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1139729