Clear correlations observed between YBa2Cu3O(7-delta) thin-film properties and GHz microwave resonator performance

The fabrication and measurement of 5 GHz microstrip resonators from a series of YBa2Cu3O(7-delta) thin films grown on LaAlO3(001) substrates by in situ laser ablation are reported. The correlations between unloaded quality factor and various film properties are studied. It is found that in general,...

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Bibliographic Details
Published in:Applied physics letters 1991-04, Vol.58, p.1789-1791
Main Authors: Young, K H, Negrete, G V, Hammond, R B, Inam, A, Ramesh, R
Format: Article
Language:English
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Summary:The fabrication and measurement of 5 GHz microstrip resonators from a series of YBa2Cu3O(7-delta) thin films grown on LaAlO3(001) substrates by in situ laser ablation are reported. The correlations between unloaded quality factor and various film properties are studied. It is found that in general, higher transition temperature, higher critical current density, sharper transition, sharper channeling pattern, and narrower X-ray rocking curve correlate positively with good microwave performance. The best quality factor exists for a narrow growth temperature window. The dependence of quality factor on device power for each film are also reported. (Author)
ISSN:0003-6951