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Bridge type Josephson junctions in MO-CVD thin films
Using Y 1 Ba 2 Cu 3 O 7- x thin films, bridge type Josephson junctions are fabricated. Thin films of Y 1 Ba 2 Cu 3 O 7- x on (100) MgO substrates are deposited by the MO-CVD method. These films exhibit zero resistance at 86 K, and a critical current density of 10 4 to 10 5 A/cm 2 at 77 K. The effect...
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Published in: | Japanese Journal of Applied Physics 1989-09, Vol.28 (9), p.L1581-L1584 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Using Y
1
Ba
2
Cu
3
O
7-
x
thin films, bridge type Josephson junctions are fabricated. Thin films of Y
1
Ba
2
Cu
3
O
7-
x
on (100) MgO substrates are deposited by the MO-CVD method. These films exhibit zero resistance at 86 K, and a critical current density of 10
4
to 10
5
A/cm
2
at 77 K. The effect of radio frequency irradiations to the bridge are investigated. Sharp microwave-induced steps are observed up to 800 µV at 77 K for X band irradiation. Clear Shapiro steps are also observed at the millimeter (101 GHz) and submillimeter frequency (303 GHz). The results demonstrate that the thin film bridges made by MO-CVD show an ideal ac Josephson effect. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/jjap.28.l1581 |