A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

It is demonstrated that in applying the FD-TD technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1991-12, Vol.39 (12), p.2176-2181
Main Authors: Ko, W.L., Mittra, R.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit analysis
Circuit properties
Damping
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Extrapolation
Frequency domain analysis
Frequency estimation
Integrated circuit modeling
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Microwave integrated circuits
Microwave theory and techniques
Sampling methods
Scattering parameters
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Summary:It is demonstrated that in applying the FD-TD technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony's methods achieves the same type of accuracy with a time record computed over a much shorter time.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.106561