Ellipsometric determination of the optical constants of C60 (Buckminsterfullerene) films

We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the...

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Bibliographic Details
Published in:Applied physics letters 1991-11, Vol.59 (21), p.2678-2680
Main Authors: REN, S. L, WANG, Y, EKLUND, P. C, RAO, A. M, MCRAE, E, HOLDEN, J. M, HAGER, T, WANG, K, WEN-TSE LEE, NI, H. F, SELEGUE, J
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
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Summary:We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.105907