An atomic-resolution atomic-force microscope implemented using an optical lever

We present the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). The native oxide on silicon was imaged with atomic resolution, and ≊5-nm resolution images of aluminum, mechanically ground iron, and corroded stainless steel were...

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Bibliographic Details
Published in:Journal of applied physics 1989, Vol.65 (1), p.164-167
Main Authors: ALEXANDER, S, HELLEMANS, L, MARTI, O, SCHNEIR, J, ELINGS, V, HANSMA, P. K, LONGMIRE, M, GURLEY, J
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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Summary:We present the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). The native oxide on silicon was imaged with atomic resolution, and ≊5-nm resolution images of aluminum, mechanically ground iron, and corroded stainless steel were obtained. The relative merits of an optical implementation of the AFM as opposed to a tunneling implementation are discussed.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.342563