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New negative differential resistance effects in the negative resistance field-effect transistor
We report two new effects of negative differential resistance in the modulation-doped AlGaAs/GaAs negative resistance field-effect transistor. Both effects are well controlled by a third electrode. Presence of a top n+ AlGaAs layer causes a hot-electron real-space transfer to this layer, and prevent...
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Published in: | Journal of applied physics 1989-09, Vol.66 (5), p.2186-2188 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We report two new effects of negative differential resistance in the modulation-doped AlGaAs/GaAs negative resistance field-effect transistor. Both effects are well controlled by a third electrode. Presence of a top n+ AlGaAs layer causes a hot-electron real-space transfer to this layer, and prevents the electron transfer to the collector. Creation of the high-field domain in the source-drain channel is needed to activate the hot-electron injection to the collector. The real-space transfer to the top n+AlGaAs layer, combined with the quenching of the high-field domain by the collector bias, are responsible for the appearance of the observed new negative differential resistance effects. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.344316 |