Submillimeter optical reflectometry

The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed. Techniques, system performances,...

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Bibliographic Details
Published in:Journal of lightwave technology 1989-08, Vol.7 (8), p.1225-1233
Main Authors: Gilgen, H.H., Novak, R.P., Salathe, R.P., Hodel, W., Beaud, P.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Frequency
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Optical attenuators
Optical harmonic generation
Optical instruments, equipment and techniques
Optical mixing
Optical modulation
Optical receivers
Optical waveguides
Physics
Reflectometry
Refractometers and reflectometers
Spatial resolution
Stimulated emission
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Summary:The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed. Techniques, system performances, and experimental results are discussed for OTDRs and for OLCRs. Fields of applications for these techniques are indicated, and some preliminary conclusions are presented. A dynamic range of approximately 100 dB and a spatial resolution in the range of 10-60 mu m were achieved with both types of reflectometers. Nondestructive diagnostics on waveguide components and integrated optics circuits are feasible at these performance levels.< >
ISSN:0733-8724
1558-2213
DOI:10.1109/50.32387