Layered van der Waals Topological Metals of TaTMTe4 (TM = Ir, Rh, Ru) Family

• Published in: The journal of physical chemistry letters 2021-07, Vol.12 (28), p.6730-6735
• Main Authors: Shipunov, G., Piening, B. R., Wuttke, C., Romanova, T. A., Sadakov, A. V., Sobolevskiy, O. A., Guzovsky, E. Yu, Usoltsev, A. S., Pudalov, V. M., Efremov, D. V., Subakti, S., Wolf, D., Lubk, A., Büchner, B., Aswartham, S.
• Format: Article
• Language: English
• Subjects: Physical Insights into Quantum Phenomena and Function
• ISSN: 1948-7185; 1948-7185
• DOI: 10.1021/acs.jpclett.1c01648

Layered van der Waals materials of the family TaTMTe4 (TM = Ir, Rh, Ru) are showing interesting electronic properties. We report the growth and characterization of TaIrTe4, TaRhTe4, TaIr1–x Rh x Te4 (x = 0.06, 0.14, 0.78, 0.92), Ta1+x Ru1–x Te4 single crystals. X-ray powder diffraction confirms that TaRhTe4 is isostructural to TaIrTe4. All these compounds are metallic with diamagnetic behavior. Below T ≈ 4 K we observed signatures of the superconductivity in the TaIr1–x Rh x Te4 compounds for x = 0.92. All samples show weak quadratic-in-field magnetoresistance (MR). However, for TaIr1–x Rh x Te4 with x ≈ 0.78, the MR has a linear term dominating in low fields that indicates the presence of Dirac cones in the vicinity of the Fermi energy. For TaRhTe4 series the MR is almost isotropic. Electronic structure calculations for TaIrTe4 and TaRhTe4 reveal appearance of the Rh band close to the Fermi level.