X-ray, electron, and ion beam induced modifications of poly(ether sulfone)

• Published in: Macromolecules 1991-01, Vol.24 (1), p.99-105
• Main Authors: Marletta, Giovanni, Pignataro, Salvatore, Toth, Andras, Bertoti, Imre, Szekely, Tamas, Keszler, Balazs
• Format: Article
• Language: English
• Subjects: Applied sciences; Exact sciences and technology; Grafting and modifications; Physicochemistry of polymers; Polymers and radiations
• ISSN: 0024-9297; 1520-5835
• DOI: 10.1021/ma00001a016

The chemical modifications induced by several types of radiation on aromatic poly(ether sulfone) (poly(oxy-1,4-phenylenesulfonyl-1,4-phenylene)) have been studied by ESCA. In particular, the effects of soft X-rays (Mg K alpha radiation at 1253.6 eV), 1.1 keV electrons and 1 keV Ar exp + and N sub 2 exp + ions are compared. The following compositional effects are observed: the depletion of sulfur and oxygen with respect to carbon, and the reduction of SO sub 2 groups to S. This is apparently the first time that the latter process has been observed in high-energy irradiation experiments. The relative importance of these two processes depends on the nature of the projectiles employed. In the case of ion bombardment both processes are enhanced. During ion bombardment the O:S ration decreases more quickly, and the gradual destruction of the phenyl rings is also observed. On the contrary, when photon or electron beams are used, the O is lost more slowly and the phenyl rings remain almost intact. A reaction mechanism for the radiation-induced reduction of the sulfonyl group is proposed on the basis of the ESCA data. Graphs. 24 ref.--AA