X-ray photoelectron holography of ultrathin film and single crystal Cu(111): improving the accuracy of bond-length determination

• Published in: Surface science 1991-04, Vol.245 (3), p.L190-L194
• Main Authors: Hardcastle, S, Han, Z.-L, Harp, G.R, Zhang, J, Chen, B.L, Saldin, D.K, Tonner, B.P
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Physics; Solid surfaces and solid-solid interfaces; Surface and interface dynamics and vibrations; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/0039-6028(91)90025-N

Forward-scattering diffraction patterns from single-crystal Cu(111) substrates and an epitaxial film of FCC Cu/Ir(111) have been analyzed to produce real-space images of the atomic lattice by Fourier-transform holography. The accuracy of atomic positions is found to be better in the single-crystal holograms than in the ultrathin film of copper. The angular dependence of the atomicscattering factor produces a shift in the position of atoms in the holographic image, and causes the atom image to be asymmetric. Model calculations reproduce the atom shift and asymmetry. A modified Fourier-transform algorithm is shown to correct for both the atom-shift and the image asymmetry.