Waveguide refractometry of multilayer planar polymeric structures

The possibility of using the method of waveguide refractometry for the determination of refractive indices and thicknesses of individual layers in a multilayer film system was explored. Dispersion functions have been derived for a symmetric three-layer stack and an algorithm for optimization of para...

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Bibliographic Details
Published in:Polymer science USSR 1989-06, Vol.30 (6), p.1402-1408
Main Authors: Sukhov, V M, Rudoi, V M
Format: Article
Language:English
Online Access:Get full text
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Summary:The possibility of using the method of waveguide refractometry for the determination of refractive indices and thicknesses of individual layers in a multilayer film system was explored. Dispersion functions have been derived for a symmetric three-layer stack and an algorithm for optimization of parameters that characterize individual layers has been derived and implemented. The applicability of the procedure was checked experimentally on a model system PVC-PE-PVC.
ISSN:0032-3950