X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal

A reasonably perfect cyclotrimethyl-enetrinitramine (RDX) explosive crystal has been studied by surface reflection (Berg-Barrett) X-ray topography for the purpose of further elucidating the microstructural basis for hot spots forming in secondary explosives. Topographs were obtained through the base...

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Bibliographic Details
Published in:Journal of materials science 1989-04, Vol.24 (4), p.1273-1280
Main Authors: ELBAN, W. L, ARMSTRONG, R. W, YOO, K. C, ROSEMEIER, R. G, YEE, R. Y
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of crystal growth
physics of crystal growth
Physics
Theory and models of crystal growth
physics of crystal growth, crystal morphology and orientation
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Summary:A reasonably perfect cyclotrimethyl-enetrinitramine (RDX) explosive crystal has been studied by surface reflection (Berg-Barrett) X-ray topography for the purpose of further elucidating the microstructural basis for hot spots forming in secondary explosives. Topographs were obtained through the base (2@u-10) surface of a crystal grown by slow evaporation from an acetone solution. (7@u-21@u-) and (6@u-32@u-) relection have revealed the central strain field of a large growth defect. This type of defect is proposed to be a suitable internal obstacle for triggering dislocation pile-up collapse during crystal deformation and fracture.
ISSN:0022-2461
1573-4803
DOI:10.1007/BF02397058