Flux creep in Bi2Sr2CaCu2O8 epitaxial films

We incorporate the experimentally deduced flux line potential well structure into the flux creep model. Application of this approach to the resistive transition in Bi2Sr2CaCu2O8 epitaxial films explains the power law voltage-current characteristics and the nonlinear current dependence of the activat...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1990-04, Vol.56 (17), p.1700-1702
Main Authors: ZELDOV, E, AMER, N. M, KOREN, G, GUPTA, A
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Physics
Properties of type I and type II superconductors
Superconductivity
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We incorporate the experimentally deduced flux line potential well structure into the flux creep model. Application of this approach to the resistive transition in Bi2Sr2CaCu2O8 epitaxial films explains the power law voltage-current characteristics and the nonlinear current dependence of the activation energy. The results cannot be accounted for by a transition into a superconducting vortex-glass phase.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.103220