Finite size effects in crystalline/amorphous multilayers

Extended X-ray diffraction experiments have been used to investigate the structure of Pb/Ge multilayers with a small ( < 15) number of bilayers. The detailed finite size structure in the X-ray diffraction profiles indicates that the multilayers are of very high quality. A one-dimensional kinemati...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 1990-05, Vol.2 (18), p.4111-4118
Main Authors: Neerinck, D, Vanderstraeten, H, Stockman, L, Locquet, J -P, Bruynseraede, Y, Schuller, I K
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Extended X-ray diffraction experiments have been used to investigate the structure of Pb/Ge multilayers with a small ( < 15) number of bilayers. The detailed finite size structure in the X-ray diffraction profiles indicates that the multilayers are of very high quality. A one-dimensional kinematical calculation for these diffraction profiles is presented, including continuous and discrete random fluctuations in layer thickness. The introduction of both continuous and discrete fluctuations causes a decrease in the number of secondary single-layer "finite size" maxima in the high angle region, in agreement with the experimental results. No quantitative agreement is reached for the low angle region, which shows more finite size structure than predicted by the fluctuations deduced from the high angle region. Diffraction patterns. 11 ref.--AA
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/2/18/007