Finite size effects in crystalline/amorphous multilayers

• Published in: Journal of physics. Condensed matter 1990-05, Vol.2 (18), p.4111-4118
• Main Authors: Neerinck, D, Vanderstraeten, H, Stockman, L, Locquet, J -P, Bruynseraede, Y, Schuller, I K
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties; Physics; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
• ISSN: 0953-8984; 1361-648X
• DOI: 10.1088/0953-8984/2/18/007

Extended X-ray diffraction experiments have been used to investigate the structure of Pb/Ge multilayers with a small ( < 15) number of bilayers. The detailed finite size structure in the X-ray diffraction profiles indicates that the multilayers are of very high quality. A one-dimensional kinematical calculation for these diffraction profiles is presented, including continuous and discrete random fluctuations in layer thickness. The introduction of both continuous and discrete fluctuations causes a decrease in the number of secondary single-layer "finite size" maxima in the high angle region, in agreement with the experimental results. No quantitative agreement is reached for the low angle region, which shows more finite size structure than predicted by the fluctuations deduced from the high angle region. Diffraction patterns. 11 ref.--AA