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Fully Bottom‐Up Waste‐Free Growth of Ultrathin Silicon Wafer via Self‐Releasing Seed Layer

The fabrication of ultrathin silicon wafers at low cost is crucial for advancing silicon electronics toward stretchability and flexibility. However, conventional fabrication techniques are inefficient because they sacrifice a large amount of substrate material. Thus, advanced silicon electronics tha...

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Published in:Advanced materials (Weinheim) 2021-10, Vol.33 (41), p.e2103708-n/a
Main Authors: Hong, Ji‐Eun, Lee, Yonghwan, Mo, Sung‐In, Jeong, Hye‐Seong, An, Jeong‐Ho, Song, Hee‐eun, Oh, Jihun, Bang, Junhyeok, Oh, Joon‐Ho, Kim, Ka‐Hyun
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cited_by cdi_FETCH-LOGICAL-c3508-7acd114698cc89426335ccd722c109be643c5d4f11402b21c9a3a6210f4ab54b3
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creator Hong, Ji‐Eun
Lee, Yonghwan
Mo, Sung‐In
Jeong, Hye‐Seong
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Song, Hee‐eun
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Bang, Junhyeok
Oh, Joon‐Ho
Kim, Ka‐Hyun
description The fabrication of ultrathin silicon wafers at low cost is crucial for advancing silicon electronics toward stretchability and flexibility. However, conventional fabrication techniques are inefficient because they sacrifice a large amount of substrate material. Thus, advanced silicon electronics that have been realized in laboratories cannot move forward to commercialization. Here, a fully bottom‐up technique for producing a self‐releasing ultrathin silicon wafer without sacrificing any of the substrate is presented. The key to this approach is a self‐organized nanogap on the substrate fabricated by plasma‐assisted epitaxial growth (plasma‐epi) and subsequent hydrogen annealing. The wafer thickness can be independently controlled during the bulk growth after the formation of plasma‐epi seed layer. In addition, semiconductor devices are realized using the ultrathin silicon wafer. Given the high scalability of plasma‐epi and its compatibility with conventional semiconductor process, the proposed bottom‐up wafer fabrication process will open a new route to developing advanced silicon electronics. A fully bottom‐up technique for fabricating a self‐releasing ultrathin silicon wafer without sacrificing any of the substrate is presented, whereas conventional technologies waste large amounts of such material. A plasma‐assisted epitaxially grown silicon seed layer with a self‐organized nanogap is a key for the realization of the fully bottom‐up process. The results represent a technological breakthrough in advanced silicon microelectronics and photovoltaics.
doi_str_mv 10.1002/adma.202103708
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subjects Commercialization
Copper
Electronics
Epitaxial growth
epitaxial Si
kerfless wafer fabrication
Plasma
self‐releasing layer
Semiconductor devices
Silicon substrates
Silicon wafers
single‐batch reactor
Stretchability
ultrathin Si
title Fully Bottom‐Up Waste‐Free Growth of Ultrathin Silicon Wafer via Self‐Releasing Seed Layer
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