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Influence of STM tip on electronic structure: Si(100) dimers

There are strong reasons for believing that dimers in defect-free regions of the Si(100) surface are asymmetric (tilted), but they appear to be symmetric in STM images. It has been suggested that these symmetric images result from a strong distortion of the dimer's electronic structure (and, as...

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Published in:Ultramicroscopy 1992-07, Vol.42 (A), p.97-104
Main Authors: Huang, Z.-H., Allen, R.E.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3
cites cdi_FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3
container_end_page 104
container_issue A
container_start_page 97
container_title Ultramicroscopy
container_volume 42
creator Huang, Z.-H.
Allen, R.E.
description There are strong reasons for believing that dimers in defect-free regions of the Si(100) surface are asymmetric (tilted), but they appear to be symmetric in STM images. It has been suggested that these symmetric images result from a strong distortion of the dimer's electronic structure (and, as a consequence, its geometry) when the STM voltage is applied. Here we report first-principles calculations for the Si(100) surface in the presence of a voltage applied by a simple model of an STM tip: a uniform sphere of charge, 1.06 Å in diameter and centered 2.5 Å above the surface. For voltages comparable to those used in STM experiments, there is only a very small distortion of the electronic structure, both below and above the Fermi energy E F. Even for large applied voltages, the results indicate that the STM images should be far from symmetric. On the other hand, the time-averaged charge densities for rapidly flipping asymmetric dimers are fully consistent with the STM observations.
doi_str_mv 10.1016/0304-3991(92)90251-E
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_25745835</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>030439919290251E</els_id><sourcerecordid>25745835</sourcerecordid><originalsourceid>FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3</originalsourceid><addsrcrecordid>eNp9kMFKAzEQhoMoWKtv4CEHkfawOtkkm42IIKVqoeKh9RzSJAuR7W5NdgXf3qyVHj3N5Zt__vkQuiRwQ4AUt0CBZVRKMpH5VELOSTY_QiNSCpnlIqfHaHRATtFZjB8AQICVI3S_aKq6d41xuK3wav2KO7_DbYNd7UwX2sYbHLvQm64P7g6v_IQATLH1WxfiOTqpdB3dxd8co_en-Xr2ki3fnhezx2VmGIUu45oXhWMahNRiQyphGLANs0JIBtSWEgw4bokUkHgurAXhLMtzKCDBGzpG1_vcXWg_exc7tfXRuLrWjWv7qHIuGC8pTyDbgya0MQZXqV3wWx2-FQE1qFKDBzV4UDJXv6rUPK1d_eXraHRdBd0YHw-7jKYqqdoYPewxl3798i6oaPygzvqQZCnb-v_v_ACvzXm6</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25745835</pqid></control><display><type>article</type><title>Influence of STM tip on electronic structure: Si(100) dimers</title><source>Backfile Package - Physics General</source><creator>Huang, Z.-H. ; Allen, R.E.</creator><creatorcontrib>Huang, Z.-H. ; Allen, R.E.</creatorcontrib><description>There are strong reasons for believing that dimers in defect-free regions of the Si(100) surface are asymmetric (tilted), but they appear to be symmetric in STM images. It has been suggested that these symmetric images result from a strong distortion of the dimer's electronic structure (and, as a consequence, its geometry) when the STM voltage is applied. Here we report first-principles calculations for the Si(100) surface in the presence of a voltage applied by a simple model of an STM tip: a uniform sphere of charge, 1.06 Å in diameter and centered 2.5 Å above the surface. For voltages comparable to those used in STM experiments, there is only a very small distortion of the electronic structure, both below and above the Fermi energy E F. Even for large applied voltages, the results indicate that the STM images should be far from symmetric. On the other hand, the time-averaged charge densities for rapidly flipping asymmetric dimers are fully consistent with the STM observations.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/0304-3991(92)90251-E</identifier><identifier>CODEN: ULTRD6</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Physics ; Solid surfaces and solid-solid interfaces ; Surface structure and topography ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Ultramicroscopy, 1992-07, Vol.42 (A), p.97-104</ispartof><rights>1992</rights><rights>1993 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3</citedby><cites>FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/030439919290251E$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3632,23930,23931,25140,27924,27925,46012</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=4322004$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Huang, Z.-H.</creatorcontrib><creatorcontrib>Allen, R.E.</creatorcontrib><title>Influence of STM tip on electronic structure: Si(100) dimers</title><title>Ultramicroscopy</title><description>There are strong reasons for believing that dimers in defect-free regions of the Si(100) surface are asymmetric (tilted), but they appear to be symmetric in STM images. It has been suggested that these symmetric images result from a strong distortion of the dimer's electronic structure (and, as a consequence, its geometry) when the STM voltage is applied. Here we report first-principles calculations for the Si(100) surface in the presence of a voltage applied by a simple model of an STM tip: a uniform sphere of charge, 1.06 Å in diameter and centered 2.5 Å above the surface. For voltages comparable to those used in STM experiments, there is only a very small distortion of the electronic structure, both below and above the Fermi energy E F. Even for large applied voltages, the results indicate that the STM images should be far from symmetric. On the other hand, the time-averaged charge densities for rapidly flipping asymmetric dimers are fully consistent with the STM observations.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface structure and topography</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNp9kMFKAzEQhoMoWKtv4CEHkfawOtkkm42IIKVqoeKh9RzSJAuR7W5NdgXf3qyVHj3N5Zt__vkQuiRwQ4AUt0CBZVRKMpH5VELOSTY_QiNSCpnlIqfHaHRATtFZjB8AQICVI3S_aKq6d41xuK3wav2KO7_DbYNd7UwX2sYbHLvQm64P7g6v_IQATLH1WxfiOTqpdB3dxd8co_en-Xr2ki3fnhezx2VmGIUu45oXhWMahNRiQyphGLANs0JIBtSWEgw4bokUkHgurAXhLMtzKCDBGzpG1_vcXWg_exc7tfXRuLrWjWv7qHIuGC8pTyDbgya0MQZXqV3wWx2-FQE1qFKDBzV4UDJXv6rUPK1d_eXraHRdBd0YHw-7jKYqqdoYPewxl3798i6oaPygzvqQZCnb-v_v_ACvzXm6</recordid><startdate>19920701</startdate><enddate>19920701</enddate><creator>Huang, Z.-H.</creator><creator>Allen, R.E.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19920701</creationdate><title>Influence of STM tip on electronic structure: Si(100) dimers</title><author>Huang, Z.-H. ; Allen, R.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface structure and topography</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Z.-H.</creatorcontrib><creatorcontrib>Allen, R.E.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Z.-H.</au><au>Allen, R.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of STM tip on electronic structure: Si(100) dimers</atitle><jtitle>Ultramicroscopy</jtitle><date>1992-07-01</date><risdate>1992</risdate><volume>42</volume><issue>A</issue><spage>97</spage><epage>104</epage><pages>97-104</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><coden>ULTRD6</coden><abstract>There are strong reasons for believing that dimers in defect-free regions of the Si(100) surface are asymmetric (tilted), but they appear to be symmetric in STM images. It has been suggested that these symmetric images result from a strong distortion of the dimer's electronic structure (and, as a consequence, its geometry) when the STM voltage is applied. Here we report first-principles calculations for the Si(100) surface in the presence of a voltage applied by a simple model of an STM tip: a uniform sphere of charge, 1.06 Å in diameter and centered 2.5 Å above the surface. For voltages comparable to those used in STM experiments, there is only a very small distortion of the electronic structure, both below and above the Fermi energy E F. Even for large applied voltages, the results indicate that the STM images should be far from symmetric. On the other hand, the time-averaged charge densities for rapidly flipping asymmetric dimers are fully consistent with the STM observations.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/0304-3991(92)90251-E</doi><tpages>8</tpages></addata></record>
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1879-2723
language eng
recordid cdi_proquest_miscellaneous_25745835
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subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
title Influence of STM tip on electronic structure: Si(100) dimers
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T20%3A37%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20of%20STM%20tip%20on%20electronic%20structure:%20Si(100)%20dimers&rft.jtitle=Ultramicroscopy&rft.au=Huang,%20Z.-H.&rft.date=1992-07-01&rft.volume=42&rft.issue=A&rft.spage=97&rft.epage=104&rft.pages=97-104&rft.issn=0304-3991&rft.eissn=1879-2723&rft.coden=ULTRD6&rft_id=info:doi/10.1016/0304-3991(92)90251-E&rft_dat=%3Cproquest_cross%3E25745835%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c430t-5a566e4a079a7b1f7c404b4d779403d890c0e5d197043057dd07ed422060f7cb3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=25745835&rft_id=info:pmid/&rfr_iscdi=true