Investigation of the structure of real indium antimonide surfaces by the asymptotic Bragg diffraction method

The structure of thin InSb(111) crystal surface layer has been studied by the asymptotic X-ray Bragg diffraction method. A substrate-oxide film interface with a thickness of a few monolayers has been found. Possible models of the interface structure are discussed.

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Bibliographic Details
Published in:Surface science 1992-09, Vol.275 (1), p.131-136
Main Authors: Afanas'ev, A.M., Imamov, R.M., Lomov, A.A., Margushev, Z.Ch, Maslov, A.V.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Description
Summary:The structure of thin InSb(111) crystal surface layer has been studied by the asymptotic X-ray Bragg diffraction method. A substrate-oxide film interface with a thickness of a few monolayers has been found. Possible models of the interface structure are discussed.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(92)90656-Q