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Phason-strain identification for quasicrystals by high-resolution electron microscopy
The simulation of high-resolution electron microscope images and corresponding electron diffraction patterns for perfect quasicrystals and quasicrystals with phason strain is carried out on the basis of high-dimensional crystal which gives a quasicrystal by cutting it with the physical space. The im...
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Published in: | Ultramicroscopy 1992-11, Vol.45 (3), p.299-305 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The simulation of high-resolution electron microscope images and corresponding electron diffraction patterns for perfect quasicrystals and quasicrystals with phason strain is carried out on the basis of high-dimensional crystal which gives a quasicrystal by cutting it with the physical space. The image-contrast change with the change of defocus and phason-strain strength is shown. The stimulated image for a phason-defected quasicrystal of Al-Cu-Li alloy is in good agreement with the experimental image. It is demonstrated that the local phason strain in quasicrystal can be identified by image simulation, even under the weak phase object approximation. |
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ISSN: | 0304-3991 1879-2723 |
DOI: | 10.1016/0304-3991(92)90141-6 |