Raman scattering from H or O terminated porous Si

The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.

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Bibliographic Details
Published in:Applied physics letters 1992-05, Vol.60 (18), p.2279-2281
Main Authors: TSANG, J. C, TISCHLER, M. A, COLLINS, R. T
Format: Article
Language:English
Subjects:
Chemistry
Electrochemistry
Exact sciences and technology
General and physical chemistry
Kinetics and mechanism of reactions
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Description
Summary:The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.107054