Sensitive method for the measurement of the Kerr magneto-optic effect

Apparatus for the measurement of the transverse Kerr magnetooptic effect is described. The instrument was based on a standard research ellipsometer in a polarizer, compensator, sample, analyzer configuration. The light source was a laser whose intensity was acoustooptically modulated. At the same ti...

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Bibliographic Details
Published in:Review of scientific instruments 1992-02, Vol.63 (2), p.1798-1804
Main Author: MINDEN, H. T
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Optical instruments, equipment and techniques
Physics
Online Access:Get full text
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Summary:Apparatus for the measurement of the transverse Kerr magnetooptic effect is described. The instrument was based on a standard research ellipsometer in a polarizer, compensator, sample, analyzer configuration. The light source was a laser whose intensity was acoustooptically modulated. At the same time the magnetization of the magnetic film sample was modulated by the field of a nearby coil. The frequency of the magnetooptic modulation was much less than that of the intensity. Both the intensity and magnetooptic signals were measured as functions of the analyzer and polarizer angles. The automation of the measurement is outlined. The methods are described by means of which the magnetooptic variation in psi and delta were calculated. Typical experimental results are presented for ferromagnetic films which were overcoated with a multilayer dielectric stack. (Author)
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1143839