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Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings
A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intr...
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Published in: | Thin solid films 1992-01, Vol.207 (1), p.117-125 |
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container_end_page | 125 |
container_issue | 1 |
container_start_page | 117 |
container_title | Thin solid films |
container_volume | 207 |
creator | Lyubimov, V.V. Voevodin, A.A. Spassky, S.E. Yerokhin, A.L. |
description | A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intrinsic stresses caused by interstitials are performed for TiN and titanium layers on stainless steel substrates. Coating failures as a result of a single layer failure, interface crack propagation and peeling above an area with imperfect adhesion are discussed. The model enables the determination of optimal thicknesses and deposition conditions of layers. X-ray diffraction stress measurements make it possible to estimate the model errors, which are found to be 15%–20%. As an example, calculations for PVD coatings with TiN and titanium layers are carried out. It is concluded that it is useful to interpose the ceramic and metal layers to reduce interface shear forces. |
doi_str_mv | 10.1016/0040-6090(92)90111-N |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_25905419</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>004060909290111N</els_id><sourcerecordid>25905419</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-7b65f497115447ab743258982d09bce356ecb75c0af42ebc248561878a0d7be53</originalsourceid><addsrcrecordid>eNp9kLFO5DAQhi3ESSwcb0DhAiEowtmOncQNElpxgIS44o7acpwJGHmT4HGQ8vZ4bxEl1UzxfTP6f0JOOLvkjFe_GJOsqJhm51pcaMY5Lx73yIo3tS5EXfJ9svpCDsgh4itjjAtRrgj8TREQqR1sWNBvl4721oc5Ap1GRN_64NNCLWLmNjAkOvZ0M4fkg10g0ukle86GsNB3O41zpB1k0SfoqBtt8sMz_iQ_ehsQjj_nEXn6ffNvfVc8_Lm9X18_FK6sZCrqtlK91DXnSsratrUshWp0IzqmWwelqsC1tXLM9lJA64RsVJVTNpZ1dQuqPCJnu7tTHN9mwGQ2Hh2EYAcYZzRCaaYk1xmUO9DFnDFCb6boNzYuhjOz7dRsCzPbwowW5n-n5jFrp5_3LebIfbSD8_jlKi5VI8uMXe0wyFnfPUSDzsPgoPMRXDLd6L__8wEwCoyR</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25905419</pqid></control><display><type>article</type><title>Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings</title><source>Backfile Package - Materials Science [YMS]</source><source>Backfile Package - Physics General (Legacy) [YPA]</source><creator>Lyubimov, V.V. ; Voevodin, A.A. ; Spassky, S.E. ; Yerokhin, A.L.</creator><creatorcontrib>Lyubimov, V.V. ; Voevodin, A.A. ; Spassky, S.E. ; Yerokhin, A.L.</creatorcontrib><description>A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intrinsic stresses caused by interstitials are performed for TiN and titanium layers on stainless steel substrates. Coating failures as a result of a single layer failure, interface crack propagation and peeling above an area with imperfect adhesion are discussed. The model enables the determination of optimal thicknesses and deposition conditions of layers. X-ray diffraction stress measurements make it possible to estimate the model errors, which are found to be 15%–20%. As an example, calculations for PVD coatings with TiN and titanium layers are carried out. It is concluded that it is useful to interpose the ceramic and metal layers to reduce interface shear forces.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/0040-6090(92)90111-N</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Applied sciences ; Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Metals. Metallurgy ; Physical properties of thin films, nonelectronic ; Physics ; Solid surfaces and solid-solid interfaces ; Surface energy; thermodynamic properties ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Thin solid films, 1992-01, Vol.207 (1), p.117-125</ispartof><rights>1992</rights><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-7b65f497115447ab743258982d09bce356ecb75c0af42ebc248561878a0d7be53</citedby><cites>FETCH-LOGICAL-c364t-7b65f497115447ab743258982d09bce356ecb75c0af42ebc248561878a0d7be53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/004060909290111N$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3555,3632,27924,27925,46004,46012</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5145843$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lyubimov, V.V.</creatorcontrib><creatorcontrib>Voevodin, A.A.</creatorcontrib><creatorcontrib>Spassky, S.E.</creatorcontrib><creatorcontrib>Yerokhin, A.L.</creatorcontrib><title>Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings</title><title>Thin solid films</title><description>A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intrinsic stresses caused by interstitials are performed for TiN and titanium layers on stainless steel substrates. Coating failures as a result of a single layer failure, interface crack propagation and peeling above an area with imperfect adhesion are discussed. The model enables the determination of optimal thicknesses and deposition conditions of layers. X-ray diffraction stress measurements make it possible to estimate the model errors, which are found to be 15%–20%. As an example, calculations for PVD coatings with TiN and titanium layers are carried out. It is concluded that it is useful to interpose the ceramic and metal layers to reduce interface shear forces.</description><subject>Applied sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Physical properties of thin films, nonelectronic</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface energy; thermodynamic properties</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNp9kLFO5DAQhi3ESSwcb0DhAiEowtmOncQNElpxgIS44o7acpwJGHmT4HGQ8vZ4bxEl1UzxfTP6f0JOOLvkjFe_GJOsqJhm51pcaMY5Lx73yIo3tS5EXfJ9svpCDsgh4itjjAtRrgj8TREQqR1sWNBvl4721oc5Ap1GRN_64NNCLWLmNjAkOvZ0M4fkg10g0ukle86GsNB3O41zpB1k0SfoqBtt8sMz_iQ_ehsQjj_nEXn6ffNvfVc8_Lm9X18_FK6sZCrqtlK91DXnSsratrUshWp0IzqmWwelqsC1tXLM9lJA64RsVJVTNpZ1dQuqPCJnu7tTHN9mwGQ2Hh2EYAcYZzRCaaYk1xmUO9DFnDFCb6boNzYuhjOz7dRsCzPbwowW5n-n5jFrp5_3LebIfbSD8_jlKi5VI8uMXe0wyFnfPUSDzsPgoPMRXDLd6L__8wEwCoyR</recordid><startdate>19920130</startdate><enddate>19920130</enddate><creator>Lyubimov, V.V.</creator><creator>Voevodin, A.A.</creator><creator>Spassky, S.E.</creator><creator>Yerokhin, A.L.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19920130</creationdate><title>Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings</title><author>Lyubimov, V.V. ; Voevodin, A.A. ; Spassky, S.E. ; Yerokhin, A.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-7b65f497115447ab743258982d09bce356ecb75c0af42ebc248561878a0d7be53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Applied sciences</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Physical properties of thin films, nonelectronic</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface energy; thermodynamic properties</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lyubimov, V.V.</creatorcontrib><creatorcontrib>Voevodin, A.A.</creatorcontrib><creatorcontrib>Spassky, S.E.</creatorcontrib><creatorcontrib>Yerokhin, A.L.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lyubimov, V.V.</au><au>Voevodin, A.A.</au><au>Spassky, S.E.</au><au>Yerokhin, A.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings</atitle><jtitle>Thin solid films</jtitle><date>1992-01-30</date><risdate>1992</risdate><volume>207</volume><issue>1</issue><spage>117</spage><epage>125</epage><pages>117-125</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intrinsic stresses caused by interstitials are performed for TiN and titanium layers on stainless steel substrates. Coating failures as a result of a single layer failure, interface crack propagation and peeling above an area with imperfect adhesion are discussed. The model enables the determination of optimal thicknesses and deposition conditions of layers. X-ray diffraction stress measurements make it possible to estimate the model errors, which are found to be 15%–20%. As an example, calculations for PVD coatings with TiN and titanium layers are carried out. It is concluded that it is useful to interpose the ceramic and metal layers to reduce interface shear forces.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/0040-6090(92)90111-N</doi><tpages>9</tpages></addata></record> |
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subjects | Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Metals. Metallurgy Physical properties of thin films, nonelectronic Physics Solid surfaces and solid-solid interfaces Surface energy thermodynamic properties Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
title | Stress analysis and failure possibility assessment of multilayer physically vapour deposited coatings |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T20%3A52%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Stress%20analysis%20and%20failure%20possibility%20assessment%20of%20multilayer%20physically%20vapour%20deposited%20coatings&rft.jtitle=Thin%20solid%20films&rft.au=Lyubimov,%20V.V.&rft.date=1992-01-30&rft.volume=207&rft.issue=1&rft.spage=117&rft.epage=125&rft.pages=117-125&rft.issn=0040-6090&rft.eissn=1879-2731&rft.coden=THSFAP&rft_id=info:doi/10.1016/0040-6090(92)90111-N&rft_dat=%3Cproquest_cross%3E25905419%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c364t-7b65f497115447ab743258982d09bce356ecb75c0af42ebc248561878a0d7be53%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=25905419&rft_id=info:pmid/&rfr_iscdi=true |