Optical absorption behaviour of evaporated ZnIn sub 2 Se sub 4 thin films

The optical absorption behaviour of thin films of ZnIn sub 2 Se sub 4 formed by a vacuum deposition process was studied. The optical constants (the refractive index n, extinction coefficient k and dielectric constants are estimated for ZnIn sub 2 Se sub 4 thin films as well as the effect of heat tre...

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Bibliographic Details
Published in:Thin solid films 1995-06, Vol.261 (1-2), p.322-327
Main Authors: Hendia, T A, Soliman, L I
Format: Article
Language:English
Online Access:Get full text
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Summary:The optical absorption behaviour of thin films of ZnIn sub 2 Se sub 4 formed by a vacuum deposition process was studied. The optical constants (the refractive index n, extinction coefficient k and dielectric constants are estimated for ZnIn sub 2 Se sub 4 thin films as well as the effect of heat treatments in the wavelength range 300-2500 nm. X-ray diffraction and electron microscopy were used to obtain an insight into the structural information. ZnIn sub 2 Se sub 4 is a layer semiconductor of tetrahedral crystal structure. From the reflection and transmission data, the absorption coefficient was computed for amorphous and crystalline films. Analysis of the absorption coefficient data revealed the existence of allowed direct and indirect transitions with optical energy gaps E sub d exp opt =3.38 eV and E sub i exp opt =2.22 eV at 300K. These values were found to decrease with increasing annealing temperature.
ISSN:0040-6090