A particle detector for energetic ions

A fast ion detector based on secondary electron emission from an aluminium surface is described. The secondary electrons are accelerated by 1.2 kV and detected by two microchannel plates in cascade configuration. Applying channel plates to the secondary electrons leads to the same detector efficienc...

Full description

Saved in:
Bibliographic Details
Published in:Measurement science & technology 1995-07, Vol.6 (7), p.959-964
Main Authors: Bader, A, Sarkadi, L, Hegyesi, G, Vikor, L, Palinkas, J
Format: Article
Language:English
Subjects:
Atomic, molecular and charged-particle sources and detectors
Charged-particle beam sources and detectors
Charged-particle beam sources anddetectors
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A fast ion detector based on secondary electron emission from an aluminium surface is described. The secondary electrons are accelerated by 1.2 kV and detected by two microchannel plates in cascade configuration. Applying channel plates to the secondary electrons leads to the same detector efficiency as with the channeltron but at a much higher counting rate. The efficiency of the detector for 150 keV protons was measured as a counting rate of 0.8 at 1 MHz. (Original abstract)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/6/7/016